Works matching IS 00220744 AND DT 2007 AND VI 56 AND IP 6
1
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 257, doi. 10.1093/jmicro/dfm026
- Junzo Desaki;
- Naoya Nishida
- Article
2
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 217, doi. 10.1093/jmicro/dfm029
- Young-Min Kim;
- Jeong Yong Lee;
- Daniel Moonen;
- Kang-Il Jang;
- Youn-Joong Kim
- Article
3
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 249, doi. 10.1093/jmicro/dfm032
- Junzo Desaki;
- Naoya Nishida
- Article
4
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 225, doi. 10.1093/jmicro/dfm031
- Kyosuke Kishida;
- Mai Miyata;
- Naoyuki Wada;
- Norihiko L. Okamoto;
- Katsushi Tanaka;
- Haruyuki Inui;
- Hiroshi Koyama;
- Takeshi Hattori;
- Yasutoshi Iriyama;
- Zempachi Ogumi
- Article
5
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 243, doi. 10.1093/jmicro/dfm030
- Junzo Desaki;
- Naoya Nishida
- Article
6
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 209, doi. 10.1093/jmicro/dfm025
- Xiaorong Wang;
- Pat Sadhukhan
- Article
7
- Journal of Electron Microscopy, 2007, v. 56, n. 6, p. 235, doi. 10.1093/jmicro/dfm028
- Article