Works matching IS 00220744 AND DT 2007 AND VI 56 AND IP 1
1
- Journal of Electron Microscopy, 2007, v. 56, n. 1, p. 21
- Article
2
- Journal of Electron Microscopy, 2007, v. 56, n. 1, p. 17, doi. 10.1093/jmicro/dfl043
- Koji Kimoto;
- Kuniyasu Nakamura;
- Shinji Aizawa;
- Shigeto Isakozawa;
- Yoshio Matsui
- Article
3
- Journal of Electron Microscopy, 2007, v. 56, n. 1, p. 7, doi. 10.1093/jmicro/dfl042
- Takehiro Kasahara;
- Daisuke Shindo;
- Hideyuki Yoshikawa;
- Takafumi Sato;
- Koichi Kondo
- Article
4
- Journal of Electron Microscopy, 2007, v. 56, n. 1, p. 27
- Article
5
- Journal of Electron Microscopy, 2007, v. 56, n. 1, p. 1, doi. 10.1093/jmicro/dfl039
- Daisuke Shindo;
- Joong Jung Kim;
- Weixing Xia;
- Ki Hyun Kim;
- Nobuhiko Ohno;
- Yasuhisa Fujii;
- Nobuo Terada;
- Shinichi Ohno
- Article