Embedment-free section electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 231, doi. 10.1093/jmicro/dfl030
- By:
- Publication type:
- Article
Works matching IS 00220744 AND DT 2006 AND VI 55 AND IP 4
Results: 6
1
2
Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: I. Principle and test examples.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 215, doi. 10.1093/jmicro/dfl028
- By:
- Publication type:
- Article
3
A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 209, doi. 10.1093/jmicro/dfl027
- By:
- Publication type:
- Article
4
Visibility of Si nanoparticles embedded in an amorphous SiO2 matrix.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 201, doi. 10.1093/jmicro/dfl026
- By:
- Publication type:
- Article
5
The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 191, doi. 10.1093/jmicro/dfl025
- By:
- Publication type:
- Article
6
Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR.
- Published in:
- Journal of Electron Microscopy, 2006, v. 55, n. 4, p. 225, doi. 10.1093/jmicro/dfl029
- By:
- Publication type:
- Article