Works matching IS 00220744 AND DT 2006 AND VI 55 AND IP 3
1
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 143, doi. 10.1093/jmicro/dfl024
- Yukihiro Sugiyama;
- Yuji Inoue;
- Eiro Muneyuki;
- Hajime Haneda;
- Masayuki Fujimoto
- Article
2
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 183, doi. 10.1093/jmicro/dfl023
- Article
3
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 173, doi. 10.1093/jmicro/dfl022
- Article
4
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 137, doi. 10.1093/jmicro/dfl021
- Yohei Sato;
- Masami Terauchi;
- Yahachi Saito;
- Riichiro Saito
- Article
5
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 129, doi. 10.1093/jmicro/dfl020
- Takayuki Akaogi;
- Kenji Tsuda;
- Masami Terauchi;
- Michiyoshi Tanaka
- Article
6
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 157, doi. 10.1093/jmicro/dfl016
- Article
7
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 151, doi. 10.1093/jmicro/dfl015
- Shalini Ananda;
- Valerie Marsden
- Article
8
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 165, doi. 10.1093/jmicro/dfl013
- Sun Yunxu;
- Lin Danying;
- Rui Yanfang;
- Han Dong;
- Ma Wanyun
- Article
9
- Journal of Electron Microscopy, 2006, v. 55, n. 3, p. 123, doi. 10.1093/jmicro/dfl005
- Ichihito Narita;
- Takeo Oku;
- Hisato Tokoro;
- Katsuaki Suganuma
- Article