Works matching IS 00220744 AND DT 2006 AND VI 55 AND IP 1
Results: 8
Analysis of magnetic microstructure in MRAM bits by electron holography and Lorentz microscopy.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 17, doi. 10.1093/jmicro/dfl007
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- Article
Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 27, doi. 10.1093/jmicro/dfl006
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- Article
Analysis of ultrastructures in Fe-encapsulating onion-like fullerenes.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 13, doi. 10.1093/jmicro/dfl003
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- Article
The thermogenic center in social wasps.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 41, doi. 10.1093/jmicro/dfl002
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Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 23, doi. 10.1093/jmicro/dfl001
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Comparative structural biology of the genome: nano-scale imaging of single nucleus from different kingdoms reveals the common physicochemical property of chromatin with a 40 nm structural unit.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 31, doi. 10.1093/jmicro/dfi076
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Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 7, doi. 10.1093/jmicro/dfi075
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High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO2/SiO2/Si metal-oxide-semiconductor structures.
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- Journal of Electron Microscopy, 2006, v. 55, n. 1, p. 1, doi. 10.1093/jmicro/dfi073
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- Article