Works matching IS 00220744 AND DT 2005 AND VI 54 AND IP 6
1
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 493, doi. 10.1093/jmicro/dfi067
- Johannes Biskupek;
- Ute Kaiser;
- Konrad Gärtner
- Article
2
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 485, doi. 10.1093/jmicro/dfi077
- Jinhua Zhan;
- Yoshio Bando;
- Junqing Hu;
- Dmitri Golberg
- Article
3
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 529, doi. 10.1093/jmicro/dfi074
- Reina Suzumoto;
- Masamichi Takami;
- Takahisa Sasaki
- Article
4
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 505, doi. 10.1093/jmicro/dfi072
- Article
5
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 497, doi. 10.1093/jmicro/dfi071
- Takeo Kamino;
- Toshie Yaguchi;
- Mitsuru Konno;
- Akira Watabe;
- Tomotaka Marukawa;
- Takayuki Mima;
- Kotaro Kuroda;
- Hiroyasu Saka;
- Shigeo Arai;
- Hiroshi Makino;
- Yoshinao Suzuki;
- Keisuke Kishita
- Article
6
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 519, doi. 10.1093/jmicro/dfi070
- Steve N. Duleh;
- Jeannie T. B. Collins;
- Robert K. Pope
- Article
7
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 515, doi. 10.1093/jmicro/dfi069
- Andrey Chuvilin;
- Ute Kaiser;
- Quentin de Robillard;
- Hans-Jürgen Engelmann
- Article
8
- Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 509, doi. 10.1093/jmicro/dfi068
- M. Inoue;
- T. Tomita;
- M. Naruse;
- Z. Akase;
- Y. Murakami;
- D. Shindo
- Article