Works matching IS 00220744 AND DT 2005 AND VI 54 AND IP 5
1
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 413
- Shin Fujita;
- Hiroshi Shimoyama
- Article
2
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 445
- Article
3
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 467
- Article
4
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 437
- Takeshi Kaneko;
- Hideo Nishioka;
- Toshio Nishi;
- Hiroshi Jinnai
- Article
5
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 429
- Tetsuji Kodama;
- Xiaoyuan Li;
- Kenji Nakahira;
- Dai Ito
- Article
6
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 461
- Article
7
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 479
- Francisco Ceric;
- Doris Silva;
- Pilar Vigil
- Article
8
- Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 455
- Jing Li;
- Zheng Liu;
- Kun-peng Li;
- Jin-ming Cui;
- Qin-fen Zhang;
- Yin-yin Li;
- Jing-qiang Zhang
- Article