Works matching IS 00220744 AND DT 2005 AND VI 54 AND IP 3

Results: 20

Foreword.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 147, doi. 10.1093/jmicro/54.3.147

By:

Hideki Ichinose;
David J. Smith

Publication type:

Article

In situ quantitative analysis of etching process of human teeth by atomic force microscopy.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 299

By:

Fumio Watari

Publication type:

Article

In Memory of the late Professor John M. Cowley.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 149

By:

Sumio Iijima

Publication type:

Article

Electron diffraction from laser-aligned beams of large hydrated molecules.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 163, doi. 10.1093/jmicro/54.3.163

By:

John C H Spence

Publication type:

Article

Electron atomic scattering factors, Debye–Waller factors and the optical potential for high-energy electron diffraction.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 199

By:

Lian-Mao Peng

Publication type:

Article

Calibration of projector lens distortions.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 181

By:

F. Hüe;
C. L. Johnson;
S. Lartigue-Korinek;
G. Wang;
P. R. Buseck;
M. J. Hÿtch

Publication type:

Article

Theoretical electron energy-loss spectroscopy and its application in materials research.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 293

By:

Jing Zhu

Publication type:

Article

Nanostructure of Er3+ doped silicates.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 309

By:

Nan Yao;
Kirk Hou;
Christopher D. Haines;
Nathan Etessami;
Varadh Ranganathan;
Susan B. Halpern;
Bernard H. Kear;
Lisa C. Klein;
George H. Sigel

Publication type:

Article

Electron energy-loss spectroscopy study of ZnO nanobelts.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 287

By:

Yong Ding;
Zhong Lin Wang

Publication type:

Article

The MIDAS project at ASU: John Cowley's vision and practical results.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 151

By:

J. A. Venables;
G. G. Hembree;
J. Drucker;
P. A. Crozier;
M. R. Scheinfein

Publication type:

Article

In situ observation of the growth mechanisms of carbon nanotubes under diverse reaction conditions.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 231

By:

Renu Sharma;
Peter Rez;
Michael M. J. Treacy;
Steven J. Stuart

Publication type:

Article

HRTEM imaging of atoms at sub-Ångström resolution.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 169

By:

Michael A. O'Keefe;
Lawrence F. Allard;
Douglas A. Blom

Publication type:

Article

Characterization of charging in semiconductor device materials by electron holography.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 239, doi. 10.1093/jmicro/54.3.239

By:

Martha R. McCartney

Publication type:

Article

Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 251

By:

Jingyue Liu

Publication type:

Article

Compositional modulation in InxGa1−xN: TEM and X-ray studies.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 243

By:

Zuzanna Liliental-Weber;
Dmitri N. Zakharov;
Kin M. Yu;
Joel W. Ager;
Wladyslaw Walukiewicz;
Eugene E. Haller;
Hai Lu;
William J. Schaff

Publication type:

Article

A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 209

By:

Nobuo Tanaka

Publication type:

Article

Analysis of magnetization in nanocomposite Nd4.5(Fe,Cr)77B18.5 by electron holography and simulation.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 279

By:

Yoshitaka Aoyama;
Young-Gil Park;
Daisuke Shindo

Publication type:

Article

Contrast analysis of dislocation images in TEM–cathodoluminescence technique.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 223, doi. 10.1093/jmicro/54.3.223

By:

D. Nakaji;
V. Grillo;
N. Yamamoto;
T. Mukai

Publication type:

Article

Development of a real-time stereo transmission electron microscope.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 215

By:

Takayoshi Tanji;
Hiromochi Tanaka;
Takayuki Kojima

Publication type:

Article

Phase measurement of atomic resolution image using transport of intensity equation.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 191

By:

Kazuo Ishizuka;
Brendan Allman

Publication type:

Article