Works matching IS 00220744 AND DT 2005 AND VI 54 AND IP 2


Results: 8
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    Experimental evaluation of a spherical aberration-corrected TEM and STEM.

    Published in:
    Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 119
    By:
    • Hidetaka Sawada;
    • Takeshi Tomita;
    • Mikio Naruse;
    • Toshikazu Honda;
    • Paul Hambridge;
    • Peter Hartel;
    • Maximilian Haider;
    • Crispin Hetherington;
    • Ron Doole;
    • Angus Kirkland;
    • John Hutchison;
    • John Titchmarsh;
    • David Cockayne
    Publication type:
    Article