Works matching IS 00220744 AND DT 2005 AND VI 54 AND IP 2
1
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 99
- Masao Komatsu;
- Hirotaro Mori
- Article
2
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 127
- Agnieszka Wochna;
- Edyta Niemczyk;
- Chieko Kurono;
- Makoto Masaoka;
- Anna Majczak;
- Jakub Kędzior;
- Ewa Słomińska;
- Marcin Lipiński;
- Takashi Wakabayashi
- Article
3
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 109
- Kenji Matsuda;
- Susumu Ikeno;
- Ilona Müllerová;
- Luděk Frank
- Article
4
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 123
- Jun Yamasaki;
- Hidetaka Sawada;
- Nobuo Tanaka
- Article
5
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 143
- Article
6
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 85
- Article
7
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 139
- Kea Joo Lee;
- Chang-Hyun Park;
- Im Joo Rhyu
- Article
8
- Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 119
- Hidetaka Sawada;
- Takeshi Tomita;
- Mikio Naruse;
- Toshikazu Honda;
- Paul Hambridge;
- Peter Hartel;
- Maximilian Haider;
- Crispin Hetherington;
- Ron Doole;
- Angus Kirkland;
- John Hutchison;
- John Titchmarsh;
- David Cockayne
- Article