Works matching IS 00220744 AND DT 2005 AND VI 54

Results: 86

Foreword.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 147, doi. 10.1093/jmicro/54.3.147

By:

Hideki Ichinose;
David J. Smith

Publication type:

Article

In situ quantitative analysis of etching process of human teeth by atomic force microscopy.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 299

By:

Fumio Watari

Publication type:

Article

In Memory of the late Professor John M. Cowley.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 149

By:

Sumio Iijima

Publication type:

Article

Electron diffraction from laser-aligned beams of large hydrated molecules.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 163, doi. 10.1093/jmicro/54.3.163

By:

John C H Spence

Publication type:

Article

Electron atomic scattering factors, Debye–Waller factors and the optical potential for high-energy electron diffraction.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 199

By:

Lian-Mao Peng

Publication type:

Article

Calibration of projector lens distortions.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 181

By:

F. Hüe;
C. L. Johnson;
S. Lartigue-Korinek;
G. Wang;
P. R. Buseck;
M. J. Hÿtch

Publication type:

Article

Theoretical electron energy-loss spectroscopy and its application in materials research.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 293

By:

Jing Zhu

Publication type:

Article

Nanostructure of Er3+ doped silicates.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 309

By:

Nan Yao;
Kirk Hou;
Christopher D. Haines;
Nathan Etessami;
Varadh Ranganathan;
Susan B. Halpern;
Bernard H. Kear;
Lisa C. Klein;
George H. Sigel

Publication type:

Article

Electron energy-loss spectroscopy study of ZnO nanobelts.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 287

By:

Yong Ding;
Zhong Lin Wang

Publication type:

Article

The MIDAS project at ASU: John Cowley's vision and practical results.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 151

By:

J. A. Venables;
G. G. Hembree;
J. Drucker;
P. A. Crozier;
M. R. Scheinfein

Publication type:

Article

In situ observation of the growth mechanisms of carbon nanotubes under diverse reaction conditions.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 231

By:

Renu Sharma;
Peter Rez;
Michael M. J. Treacy;
Steven J. Stuart

Publication type:

Article

HRTEM imaging of atoms at sub-Ångström resolution.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 169

By:

Michael A. O'Keefe;
Lawrence F. Allard;
Douglas A. Blom

Publication type:

Article

Characterization of charging in semiconductor device materials by electron holography.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 239, doi. 10.1093/jmicro/54.3.239

By:

Martha R. McCartney

Publication type:

Article

Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 251

By:

Jingyue Liu

Publication type:

Article

Compositional modulation in InxGa1−xN: TEM and X-ray studies.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 243

By:

Zuzanna Liliental-Weber;
Dmitri N. Zakharov;
Kin M. Yu;
Joel W. Ager;
Wladyslaw Walukiewicz;
Eugene E. Haller;
Hai Lu;
William J. Schaff

Publication type:

Article

A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 209

By:

Nobuo Tanaka

Publication type:

Article

Analysis of magnetization in nanocomposite Nd4.5(Fe,Cr)77B18.5 by electron holography and simulation.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 279

By:

Yoshitaka Aoyama;
Young-Gil Park;
Daisuke Shindo

Publication type:

Article

Contrast analysis of dislocation images in TEM–cathodoluminescence technique.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 223, doi. 10.1093/jmicro/54.3.223

By:

D. Nakaji;
V. Grillo;
N. Yamamoto;
T. Mukai

Publication type:

Article

Development of a real-time stereo transmission electron microscope.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 215

By:

Takayoshi Tanji;
Hiromochi Tanaka;
Takayuki Kojima

Publication type:

Article

Phase measurement of atomic resolution image using transport of intensity equation.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 3, p. 191

By:

Kazuo Ishizuka;
Brendan Allman

Publication type:

Article

<it>In situ</it> HVEM study on copper oxidation using an improved environmental cell.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 99

By:

Masao Komatsu;
Hirotaro Mori

Publication type:

Article

Role of mitochondria in the switch mechanism of the cell death mode from apoptosis to necrosis—Studies on ρ0 cells.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 127

By:

Agnieszka Wochna;
Edyta Niemczyk;
Chieko Kurono;
Makoto Masaoka;
Anna Majczak;
Jakub Kędzior;
Ewa Słomińska;
Marcin Lipiński;
Takashi Wakabayashi

Publication type:

Article

The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 109

By:

Kenji Matsuda;
Susumu Ikeno;
Ilona Müllerová;
Luděk Frank

Publication type:

Article

First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 123

By:

Jun Yamasaki;
Hidetaka Sawada;
Nobuo Tanaka

Publication type:

Article

Application of 10-μm thin stainless foil to a new assembly of the specimen carrier in high-pressure freezing.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 143

By:

Tatsuo Suganuma

Publication type:

Article

Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 85

By:

Tohru Ishitani

Publication type:

Article

Efficient three-dimensional reconstruction of synapse with high-voltage electron microscopy.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 139

By:

Kea Joo Lee;
Chang-Hyun Park;
Im Joo Rhyu

Publication type:

Article

Experimental evaluation of a spherical aberration-corrected TEM and STEM.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 2, p. 119

By:

Hidetaka Sawada;
Takeshi Tomita;
Mikio Naruse;
Toshikazu Honda;
Paul Hambridge;
Peter Hartel;
Maximilian Haider;
Crispin Hetherington;
Ron Doole;
Angus Kirkland;
John Hutchison;
John Titchmarsh;
David Cockayne

Publication type:

Article

Effects of micafungin on the morphology of Aspergillus fumigatus.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 67, doi. 10.1093/jmicro/dfh100
Publication type:: Article

TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba2FeMoO6.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 61, doi. 10.1093/jmicro/dfh104
Publication type:: Article

Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 51, doi. 10.1093/jmicro/dfh103
Publication type:: Article

Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 43, doi. 10.1093/jmicro/dfh102
Publication type:: Article

A new TEM method of interfacial thin-film characterization.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 57, doi. 10.1093/jmicro/dfh101
Publication type:: Article

In vivo subcellular ultrastructures recognized with Hilbert differential contrast transmission electron microscopy.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 79, doi. 10.1093/jmicro/dfh105
Publication type:: Article

Lattice parameter determination of mullite by energy-filtered needle-texture electron diffraction pattern.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 35, doi. 10.1093/jmicro/dfh099
Publication type:: Article

Optical system for double-biprism electron holography.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 19, doi. 10.1093/jmicro/dfh098
Publication type:: Article

Ultrastructural and immunohistochemical studies of medullary bone calcification, with special reference to sulphated glycosaminoglycans.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 29, doi. 10.1093/jmicro/dfh097
Publication type:: Article

Characterization of DLC films by EELS and electron holography.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 11, doi. 10.1093/jmicro/dfh096
Publication type:: Article

Analysis of grain boundaries in CoCrTa and CoPtCrB HDD media by analytical transmission electron microscopy.

Published in:: Journal of Electron Microscopy, 2005, v. 54, n. 1, p. 1, doi. 10.1093/jmicro/dfh047
Publication type:: Article

Synthesis and microstructure of Cd4SiS6/Si composite nanowires.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 485, doi. 10.1093/jmicro/dfi077

By:

Jinhua Zhan;
Yoshio Bando;
Junqing Hu;
Dmitri Golberg

Publication type:

Article

Differentiation and function of osteoclasts cultured on bone and cartilage.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 529, doi. 10.1093/jmicro/dfi074

By:

Reina Suzumoto;
Masamichi Takami;
Takahisa Sasaki

Publication type:

Article

Morphological and functional analysis of Rac1B in Dictyostelium discoideum.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 519, doi. 10.1093/jmicro/dfi070

By:

Steve N. Duleh;
Jeannie T. B. Collins;
Robert K. Pope

Publication type:

Article

Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperatures.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 505, doi. 10.1093/jmicro/dfi072

By:

Takeo Kamino

Publication type:

Article

A new evaluation method of electron optical performance of high beam current probe forming systems.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 413

By:

Shin Fujita;
Hiroshi Shimoyama

Publication type:

Article

Electron transport in Si nanochains/nanowires.

Published in:

Journal of Electron Microscopy, 2005, v. 54, p. i15

By:

Kohno, Hideo;
Kikuo, Isamu;
Oto, Kenichi

Publication type:

Article

On the origin of HOLZ lines splitting near interfaces: multislice simulation of CBED patterns.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 515, doi. 10.1093/jmicro/dfi069

By:

Andrey Chuvilin;
Ute Kaiser;
Quentin de Robillard;
Hans-Jürgen Engelmann

Publication type:

Article

Development of a gas injection/specimen heating holder for use with transmission electron microscope.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 497, doi. 10.1093/jmicro/dfi071

By:

Takeo Kamino;
Toshie Yaguchi;
Mitsuru Konno;
Akira Watabe;
Tomotaka Marukawa;
Takayuki Mima;
Kotaro Kuroda;
Hiroyasu Saka;
Shigeo Arai;
Hiroshi Makino;
Yoshinao Suzuki;
Keisuke Kishita

Publication type:

Article

Development of a magnetizing stage for in situ observations with electron holography and Lorentz microscopy.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 509, doi. 10.1093/jmicro/dfi068

By:

M. Inoue;
T. Tomita;
M. Naruse;
Z. Akase;
Y. Murakami;
D. Shindo

Publication type:

Article

Matrix-dependent structure of GeSi nanocrystals in SiC.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 6, p. 493, doi. 10.1093/jmicro/dfi067

By:

Johannes Biskupek;
Ute Kaiser;
Konrad Gärtner

Publication type:

Article

Reduction of anisotropic image resolution in transmission electron microtomography by use of quadrangular prism-shaped section.

Published in:

Journal of Electron Microscopy, 2005, v. 54, n. 5, p. 437

By:

Takeshi Kaneko;
Hideo Nishioka;
Toshio Nishi;
Hiroshi Jinnai

Publication type:

Article