Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 6
1
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 671, doi. 10.1093/jmicro/dfh094
- Tilman Voigt;
- Wolfgang Dauber
- Article
2
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 589, doi. 10.1093/jmicro/dfh093
- Masami Terauchi;
- Atsushi Oguri;
- Kaoru Kimura;
- Akihiko Fujiwara
- Article
3
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 677
- Article
4
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 593, doi. 10.1093/jmicro/dfh091
- Takayuki Akaogi;
- Kenji Tsuda;
- Masami Terauchi;
- Michiyoshi Tanaka
- Article
5
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 583, doi. 10.1093/jmicro/dfh089
- Takeo Kamino;
- Toshie Yaguchi;
- Mitsuru Konno;
- Tsuyoshi Ohnishi;
- Tohru Ishitani
- Article
6
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 601, doi. 10.1093/jmicro/dfh088
- Article
7
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 659, doi. 10.1093/jmicro/dfh087
- Jakub Kędzior;
- Makoto Masaoka;
- Chieko Kurono;
- Jan H. Spodnik;
- Anna Hallmann;
- Anna Majczak;
- Edyta Niemczyk;
- Piotr Trzonkowski;
- Andrzej Myśliwski;
- Tsuyoshi Soji;
- Takashi Wakabayashi
- Article
8
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 635, doi. 10.1093/jmicro/dfh086
- Anna Majczak;
- Mariusz Karbowski;
- Marcin Kamiński;
- Makoto Masaoka;
- Chieko Kurono;
- Edyta Niemczyk;
- Jakub Kędzior;
- Tsuyoshi Soji;
- Dorota Knap;
- Anna Hallmann;
- Takashi Wakabayashi
- Article
9
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 649, doi. 10.1093/jmicro/dfh084
- Jacob S. Ishay;
- Dmitry Galushko;
- Natalya Ermakov;
- David J. Bergman
- Article
10
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 623, doi. 10.1093/jmicro/dfh077
- Article
11
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 617, doi. 10.1093/jmicro/dfh076
- Hai-Bo Zhang;
- Chao Yang;
- Akio Takaoka
- Article
12
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 577, doi. 10.1093/jmicro/dfh074
- Kimiya Miyashita;
- Kazuo Yamamoto;
- Tsukasa Hirayama;
- Takayoshi Tanji
- Article
13
- Journal of Electron Microscopy, 2004, v. 53, n. 6, p. 611, doi. 10.1093/jmicro/dfh069
- Toyohiko J. Konno;
- Eiji Okunishi;
- Tetsu Ohsuna;
- Kenji Hiraga
- Article