Works matching IS 00220744 AND DT 2004 AND VI 53 AND IP 3
Results: 12
Elasticity of flagellar hooks.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 305, doi. 10.1093/jmicro/53.3.305
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HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 257, doi. 10.1093/jmicro/53.3.257
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Analytical electron microscopy and electron holography on microstructures and magnetic domain structures of Sm-Co 2:17 magnets.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 267, doi. 10.1093/jmicro/53.3.267
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Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 245, doi. 10.1093/jmicro/53.3.245
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The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 237, doi. 10.1093/jmicro/53.3.237
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Silk structure in the hornet cocoon.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 293
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Monte Carlo simulation of topographic contrast in scanning ion microscope.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 229, doi. 10.1093/jmicro/53.3.229
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Chemical junction delineation of a specific site in Si devices.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 277
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Observation of iron silicide formation by plan-view transmission electron microscopy.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 223, doi. 10.1093/jmicro/53.3.223
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Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 271, doi. 10.1093/jmicro/53.3.271
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Ontogenesis of peripheral electromagnetic receptors in hornets.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 281, doi. 10.1093/jmicro/53.3.281
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Development of coincidence transmission electron microscope. III. Incorporation with γ-type imaging energy filter.
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- Journal of Electron Microscopy, 2004, v. 53, n. 3, p. 217, doi. 10.1093/jmicro/53.3.217
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- Article