Works matching IS 00220744 AND DT 2003 AND VI 52 AND IP 4
1
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 435, doi. 10.1093/jmicro/52.4.435
- Article
2
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 415, doi. 10.1093/jmicro/52.4.415
- Article
3
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 399, doi. 10.1093/jmicro/52.4.399
- Article
4
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 425, doi. 10.1093/jmicro/52.4.425
- Article
5
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 391, doi. 10.1093/jmicro/52.4.391
- Article
6
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 383, doi. 10.1093/jmicro/52.4.383
- Article
7
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 375, doi. 10.1093/jmicro/52.4.375
- Article
8
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 369, doi. 10.1093/jmicro/52.4.369
- Article
9
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 365, doi. 10.1093/jmicro/52.4.365
- Article
10
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 429, doi. 10.1093/jmicro/52.4.429
- J.C. Araujo;
- F.C. Téran;
- R.A. Oliveira;
- E.A.A. Nour;
- M.A.P. Montenegro;
- J.R. Campos;
- R.F. Vazoller
- Article
11
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 407, doi. 10.1093/jmicro/52.4.407
- M. Kuroiwa;
- K. Aoki;
- N. Izumiyama
- Article
12
- Journal of Electron Microscopy, 2003, v. 52, n. 4, p. 359, doi. 10.1093/jmicro/52.4.359
- L.Y. Chang;
- F.R. Chen;
- A.I. Kirkland;
- J.J. Kai
- Article