Works matching IS 00220744 AND DT 2003 AND VI 52 AND IP 3
1
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 309, doi. 10.1093/jmicro/52.3.309
- T. Sasaki;
- Y. Ukyo;
- K. Kuroda;
- S. Arai;
- H. Saka
- Article
2
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 305, doi. 10.1093/jmicro/52.3.305
- J-M. Yang;
- J-C. Park;
- Y-B. Park;
- J-J. Kim;
- T-S. Back;
- H-S. Lee;
- S-Y. Lee;
- S-W. Park
- Article
3
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 299, doi. 10.1093/jmicro/52.3.299
- K. Kimoto;
- K. Ishizuka;
- T. Mizoguchi;
- I. Tanaka;
- Y. Matsui
- Article
4
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 291, doi. 10.1093/jmicro/52.3.291
- Article
5
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 283, doi. 10.1093/jmicro/52.3.283
- K. Aoyama;
- R. Matsumoto;
- S. Oka
- Article
6
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 277, doi. 10.1093/jmicro/52.3.277
- T. Nitta;
- Y. Endo;
- H. Haga;
- K. Kawabata
- Article
7
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 267, doi. 10.1093/jmicro/52.3.267
- Article
8
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 255, doi. 10.1093/jmicro/52.3.255
- S. Horiuchi;
- T. Hamanaka;
- T. Aoki;
- T. Miyakawa;
- R. Narita;
- H. Wakabayashi
- Article
9
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 355, doi. 10.1093/jmicro/52.3.355
- U. Kneissler;
- S. Harendza;
- U. Helmchen
- Article
10
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 349, doi. 10.1093/jmicro/52.3.349
- Y. Kishikawa;
- H. Gong;
- T. Kitaoka;
- T. Amemiya;
- K. Takaya;
- M. Tozu;
- T. Hoshi;
- Y. Ohashi
- Article
11
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 337, doi. 10.1093/jmicro/52.3.337
- S. Suzuki;
- H. Nagayoshi;
- K. Ishino;
- N. Hino;
- H. Sugi
- Article
12
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 327, doi. 10.1093/jmicro/52.3.327
- Y. Kiyohara;
- K. Endo;
- C. Ide;
- A. Mizoguchi
- Article
13
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 313
- M. Kamin´ski;
- M. Masaoka;
- M. Karbowski;
- J. Kędzior;
- Y. Nishizawa;
- J. Usukura;
- T. Wakabayashi
- Article
14
- Journal of Electron Microscopy, 2003, v. 52, n. 3, p. 245, doi. 10.1093/jmicro/52.3.245
- C. Morita;
- S. Arai;
- Y. Enomoto;
- K. Miyauchi;
- H. Shimoyama
- Article