Works matching IS 00220744 AND DT 2003 AND VI 52 AND IP 1

Results: 14

Inhomogeneous substitution of polyhalogenated copper‐phthalocyanine studied by high‐resolution imaging and electron crystallography.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 85, doi. 10.1093/jmicro/52.1.85

By:

Kobayashi, Takashi;
Ogawa*, Tetsuya;
Moriguchi, Sakumi;
Suga, Takeo;
Yoshida, Kaname;
Kurata, Hiroki;
Isoda, Seiji

Publication type:

Article

In situ HREM observation of nucleation and growth of nanotwins beneath the solid–liquid interface in Si.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 79, doi. 10.1093/jmicro/52.1.79

By:

Arai, Shigeo;
Tsukimoto, Susumu;
Saka*, Hiroyasu

Publication type:

Article

Creep deformation of grain boundary in a highly crystalline SiC fibre.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 75, doi. 10.1093/jmicro/52.1.75

By:

Shibayama*, Tamaki;
Yoshida, Yutaka;
Yano, Yasuhide;
Takahashi, Heishichiro

Publication type:

Article

First observation of SiO2/Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 69, doi. 10.1093/jmicro/52.1.69

By:

Tanaka*, Nobuo;
Yamasaki, Jun;
Usuda, Koji;
Ikarashi, Nobuyuki

Publication type:

Article

Radiation‐induced segregation and precipitation behaviours around cascade clusters under electron irradiation.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 63, doi. 10.1093/jmicro/52.1.63

By:

Sueishi, Yuichiro;
Sakaguchi*, Norihito;
Shibayama, Tamaki;
Kinoshita, Hiroshi;
Takahashi, Heishichiro

Publication type:

Article

In situ HREM study on the structural instability of isolated nanometre‐sized alloy particles in the Sn‐Bi system.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 57, doi. 10.1093/jmicro/52.1.57

By:

Lee, Jung‐Goo;
Mori*, Hirotaro

Publication type:

Article

High‐resolution ultrahigh‐vacuum electron microscopy of helical gold nanowires: junction and thinning process.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 49, doi. 10.1093/jmicro/52.1.49

By:

Oshima, Yoshifumi;
Kondo, Yukihito;
Takayanagi*, Kunio

Publication type:

Article

Influence of Sr‐doping in Ba7Rh6O18, a new one‐dimensional oxide of the homologous series (A3Rh2O6)α(A3Rh3O9)β.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 41, doi. 10.1093/jmicro/52.1.41

By:

Hernando, María;
Boulahya, Khalid;
Varela, Aurea;
Parras, Marina;
González‐Calbet*, José M.

Publication type:

Article

Editorial.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 1, doi. 10.1093/jmicro/52.1.1

By:

Ichinose, Hideki

Publication type:

Article

Atomistic observation and simulation analysis of spatio‐temporal fluctuations during radiation‐induced amorphization.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 33, doi. 10.1093/jmicro/52.1.33

By:

Watanabe*, Seiichi;
Hoshino, Misaki;
Koike, Takuto;
Suda, Takanori;
Ohnuki, Soumei;
Takahashi, Heishichirou;
Lam, Nighi Q.

Publication type:

Article

Electron holographic 3‐D nano‐analysis of Au/TiO2 catalyst at interface.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 21, doi. 10.1093/jmicro/52.1.21

By:

Ichikawa*, Satoshi;
Akita, Tomoki;
Okumura, Mitsutaka;
Haruta, Masatake;
Tanaka, Koji;
Kohyama, Masanori

Publication type:

Article

Applications of 1 MV field‐emission transmission electron microscope.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 11, doi. 10.1093/jmicro/52.1.11

By:

Tonomura, Akira

Publication type:

Article

A spherical aberration‐corrected 200 kV TEM.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 3, doi. 10.1093/jmicro/52.1.3

By:

Hosokawa*, Fumio;
Tomita, Takeshi;
Naruse, Mikio;
Honda, Toshikazu;
Hartel, Peter;
Haider, Max

Publication type:

Article

ARHVTEM of the Pd/ZnO heterointerface chemical structure.

Published in:

Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 27, doi. 10.1093/jmicro/52.1.27

By:

Murakami, Kenji;
Saito, Mitsuhiro;
Takuma, Eriko;
Ichinose*, Hideki

Publication type:

Article