Works matching IS 00220744 AND DT 2002 AND VI 51 AND IP 6
1
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 425, doi. 10.1093/jmicro/51.6.425
- Desaki, Junzo;
- Ezaki, Taichi
- Article
2
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 413, doi. 10.1093/jmicro/51.6.413
- Sawae, Yoshiko;
- Sahara, Takako;
- Kawana, Fumi;
- Sasaki, Takahisa
- Article
3
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 401, doi. 10.1093/jmicro/51.6.401
- Ishay, Jacob S.;
- Pertsis, Vitaly
- Article
4
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 391, doi. 10.1093/jmicro/51.6.391
- Yan, Jing‐Yi;
- Chen, Fu‐Rong;
- Kai, Ji‐Jung
- Article
5
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 383, doi. 10.1093/jmicro/51.6.383
- Nakanishi, Nobuto;
- Yamazaki, Takashi;
- Rečnik, Aleksander;
- Čeh, Miran;
- Kawasaki, Masahiro;
- Watanabe, Kazuto;
- Shiojiri, Makoto
- Article
6
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 359, doi. 10.1093/jmicro/51.6.359
- Shigesato, Genichi;
- Sugiyama, Masaaki
- Article
7
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 353, doi. 10.1093/jmicro/51.6.353
- Sawada, Hidetaka;
- Ichinose, Hideki;
- Kohyama, Masanori
- Article
8
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 347, doi. 10.1093/jmicro/51.6.347
- Gregori, Giuliano;
- Kleebe, Hans‐Joachim;
- Siegelin, Frank;
- Ziegler, Günter
- Article
9
- Journal of Electron Microscopy, 2002, v. 51, n. 6, p. 369, doi. 10.1093/jmicro/51.6.369
- Ishitani, Tohru;
- Sato, Mitsugu
- Article