Works matching IS 00220744 AND DT 2002 AND VI 51 AND IP 5
1
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 341, doi. 10.1093/jmicro/51.5.341
- Osawa, Tokuji;
- Ishida2, Kinji;
- Onodera1, Masao;
- Feng1, Xin‐Yan;
- Hayashi2, Shuichiro;
- Nozaka1, Yohichiro
- Article
2
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 337, doi. 10.1093/jmicro/51.5.337
- Sameshima, Masazumi;
- Kishi1, Yoshiro;
- Osumi2, Masako;
- Mahadeo3, Dana;
- Cotter3, David A.
- Article
3
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 327, doi. 10.1093/jmicro/51.5.327
- Kodaka, Tetsuo;
- Debari2, Kazuhiro
- Article
4
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 315
- Shimizu‐Ishiura, Miho;
- Kawana, Fumi;
- Sasaki, Takahisa
- Article
5
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 311
- Tanabe1, Tetsuo;
- Muto, Shunsuke;
- Tohtake2, Satoshi
- Article
6
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 303, doi. 10.1093/jmicro/51.5.303
- Moriguchi, Sakumi;
- Isoda, Seiji;
- Kobayashi, Takashi
- Article
7
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 297, doi. 10.1093/jmicro/51.5.297
- Takuma, Eriko;
- Ichinose1, Hideki;
- Chen2, Fu‐Rong
- Article
8
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 291, doi. 10.1093/jmicro/51.5.291
- Terada, Shohei;
- Aoyama1, Takashi;
- Yano2, Fumiko;
- Mitsui2, Yasuhiro
- Article
9
- Journal of Electron Microscopy, 2002, v. 51, n. 5, p. 281, doi. 10.1093/jmicro/51.5.281
- Ohno, Yutaka;
- Takeda, Seiji
- Article