Works matching IS 00220744 AND DT 2002 AND VI 51 AND IP 2
1
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 141, doi. 10.1093/jmicro/51.2.141
- Article
2
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 137, doi. 10.1093/jmicro/51.2.137
- Shimoda, Hiroshi;
- Kajiwara, Tooru;
- Takahashi, Yoshiaki;
- Kato, Seiji
- Article
3
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 87, doi. 10.1093/jmicro/51.2.87
- Seguchi, Harumichi;
- Kobayashi, Toshihiro
- Article
4
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 93, doi. 10.1093/jmicro/51.2.93
- Aihara, Jun;
- Hojou2, Kiichi;
- Furuno2, Shigemi;
- Ishihara1, Masahiro;
- Hayashi1, Kimio
- Article
5
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 99, doi. 10.1093/jmicro/51.2.99
- Murakami, Yasukazu;
- Shindo1, Daisuke;
- Kikuchi2, Masae;
- Zuo3, Jianm‐Min;
- Spence4, John C. H.
- Article
6
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 105, doi. 10.1093/jmicro/51.2.105
- Jiao, Chengge;
- Cherns, David
- Article
7
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 113, doi. 10.1093/jmicro/51.2.113
- Pascher, Ragnar;
- Berthold2, Claes‐Henric;
- Rydmark1,2, Martin
- Article
8
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 133
- Murata1,2, Takashi;
- Karahara3, Ichirou;
- Kozuka4,5, Toshiaki;
- Giddings6, Thomas H.;
- Staehelin6, L. Andrew;
- Mineyuki, Yoshinobu
- Article
9
- Journal of Electron Microscopy, 2002, v. 51, n. 2, p. 127, doi. 10.1093/jmicro/51.2.127
- Yazama, Futoshi;
- Kadonosono2, Kazuaki;
- Itoh2, Norihiko;
- Ohno2, Shigeaki
- Article