A novel shadow‐imaging technique to measure charge distribution and lattice displacement.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 465, doi. 10.1093/jmicro/50.6.465
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- Publication type:
- Article
Works matching IS 00220744 AND DT 2001 AND VI 50 AND IP 6
Results: 17
1
2
TEM and HAADF‐STEM study of a Au catalyst supported on a TiO2 nano‐rod.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 473, doi. 10.1093/jmicro/50.6.473
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- Publication type:
- Article
3
Examination of electrostatic potential distribution across an implanted p–n junction by electron holography.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 479, doi. 10.1093/jmicro/50.6.479
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- Publication type:
- Article
4
Electron transport behaviour in Nb‐doped SrTiO3 bicrystals.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 485, doi. 10.1093/jmicro/50.6.485
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- Publication type:
- Article
5
Reactive epitaxy of Co nanoparticles on (111) Si.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 545, doi. 10.1093/jmicro/50.6.545
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- Publication type:
- Article
6
High‐resolution transmission electron microscopy observation of the cross‐sectional structure of reconstructed silicon (5,5,12) surface.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 541, doi. 10.1093/jmicro/50.6.541
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- Publication type:
- Article
7
Structure of [110] tilt grain boundaries in zirconia bicrystals.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 429, doi. 10.1093/jmicro/50.6.429
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- Publication type:
- Article
8
Application of nano‐diffraction to local atomic distribution function analysis of amorphous materials.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 435, doi. 10.1093/jmicro/50.6.435
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- Publication type:
- Article
9
Understanding magnetic structures in permanent magnets via in situ Lorentz microscopy, interferometric and non‐interferometric phase‐reconstructions.
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- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 447, doi. 10.1093/jmicro/50.6.447
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- Publication type:
- Article
10
HRTEM study of new series of oxycarbonitrate superconductors (Cu,C,N)Sr2Can–1CunOy (n = 1–6).
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 457, doi. 10.1093/jmicro/50.6.457
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- Publication type:
- Article
11
Identification of various phases in HRTEM images of MgO‐PSZ.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 443, doi. 10.1093/jmicro/50.6.443
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- Publication type:
- Article
12
Analysis of contacts and V‐defects in GaN device structures by transmission electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 489, doi. 10.1093/jmicro/50.6.489
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- Publication type:
- Article
13
Four‐dimensional dielectric property image obtained from electron spectroscopic imaging series.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 497
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- Publication type:
- Article
14
Artificial bright spots in atomic‐resolution high‐angle annular dark field STEM images.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 517, doi. 10.1093/jmicro/50.6.517
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- Publication type:
- Article
15
Advances in energy‐filtering transmission electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 509, doi. 10.1093/jmicro/50.6.509
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- Publication type:
- Article
16
Spatially‐resolved EELS analysis of multilayer using EFTEM and STEM.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 523, doi. 10.1093/jmicro/50.6.523
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- Publication type:
- Article
17
Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 6, p. 529, doi. 10.1093/jmicro/50.6.529
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- Publication type:
- Article