Nano‐area electron diffraction pattern reconstructed from three‐dimensional Fourier spectrum.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 405, doi. 10.1093/jmicro/50.5.405
- By:
- Publication type:
- Article
Works matching IS 00220744 AND DT 2001 AND VI 50 AND IP 5
Results: 8
1
2
Fourier analysis of HRTEM image deterioration caused by mechanical vibration.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 413, doi. 10.1093/jmicro/50.5.413
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- Publication type:
- Article
3
Atomic force microscopy analysis of bacteriophages ΦKZ and T4.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 417, doi. 10.1093/jmicro/50.5.417
- By:
- Publication type:
- Article
4
Acanthamoeba castellanii: ultrastructure of trophozoites using fast freeze‐fixation followed by freeze‐substitution.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 423
- By:
- Publication type:
- Article
5
Fourier images feature of lattice fringes formed by low‐loss electrons as observed using spatially‐resolved EELS technique.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 377, doi. 10.1093/jmicro/50.5.377
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- Publication type:
- Article
6
The principle of a double crystal electron interferometer.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 371, doi. 10.1093/jmicro/50.5.371
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- Publication type:
- Article
7
Electrostatic correction of the chromatic and of the spherical aberration of charged‐particle lenses.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 383
- By:
- Publication type:
- Article
8
HOLZ line analysis of lattice parameters in magnesium alloys.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 5, p. 391, doi. 10.1093/jmicro/50.5.391
- By:
- Publication type:
- Article