Works matching IS 00220744 AND DT 2001 AND VI 50 AND IP 4
1
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 325, doi. 10.1093/jmicro/50.4.325
- Oba, Keisuke;
- Gong, Huaqing;
- Amemiya, Tsugio;
- Baba, Koumei;
- Takaya, Kenichi
- Article
2
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 333, doi. 10.1093/jmicro/50.4.333
- Bonucci, Ermanno;
- Mocetti, Patrizia;
- Silvestrini, Giuliana;
- Ballanti, Paola;
- Zalzal, Sylvia;
- Fortin, Micheline;
- Nanci, Antonio
- Article
3
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 349, doi. 10.1093/jmicro/50.4.349
- Schmiedl, Andreas;
- Schnabel, Philipp A.;
- von Schmeling, Heiko Kausch Blecken;
- Marten, Katharina;
- Richter, Joachim
- Article
4
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 359, doi. 10.1093/jmicro/50.4.359
- Yamada, Sakuo;
- Sugai, Motoyuki;
- Komatsuzawa, Hitoshi;
- Matsumoto, Akira
- Article
5
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 365, doi. 10.1093/jmicro/50.4.365
- Shiotani, Aya;
- Shibasaki, Yoshinobu;
- Sasaki, Takahisa
- Article
6
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 283, doi. 10.1093/jmicro/50.4.283
- Braet, Filip;
- de Zanger, Ronald;
- Seynaeve, Carine;
- Baekeland, Marijke;
- Wisse, Eddie
- Article
7
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 291, doi. 10.1093/jmicro/50.4.291
- Article
8
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 311, doi. 10.1093/jmicro/50.4.311
- Kaiser, Ute;
- Chuvilin, Andrey;
- Saitoh, Koh;
- Richter, Wolfgang
- Article
9
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 307, doi. 10.1093/jmicro/50.4.307
- Kimoto, Koji;
- Anan, Yoshihiro;
- Asaka, Tohru;
- Zhigadlo, Nikolai D.;
- Muromachi, Eiji;
- Matsui, Yoshio
- Article
10
- Journal of Electron Microscopy, 2001, v. 50, n. 4, p. 321, doi. 10.1093/jmicro/50.4.321
- Yaguchi, Toshie;
- Sato, Takahiro;
- Kamino, Takeo;
- Taniguchi, Yoshifumi;
- Motomiya, Kenichi;
- Tohji, Kazuyuki;
- Kasuya, Atsuo
- Article