spectrum-imaging, electron energy-loss spectroscopy, scanning transmission electron microscopy, elemental mapping, multilayer.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 141
- By:
- Publication type:
- Article
Works matching IS 00220744 AND DT 2001 AND VI 50 AND IP 3
Results: 17
1
2
Foreword.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 139
- By:
- Publication type:
- Article
3
electron microscopy, scanning transmission, thin annular detectors, nanodiffraction, nanocrystals.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 147
- By:
- Publication type:
- Article
4
tenotomy, soleus muscle, denervation, tendon suture, muscle fibre, electron microscopy.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 275
- By:
- Publication type:
- Article
5
CCD camera, real-time image processing, defocus-image modulation processing, phase electron microscope, spherical aberration correction.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 271
- By:
- Publication type:
- Article
6
subgrain boundary, strain contrast, nucleation, [bgr]SiN, dislocation.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 265
- By:
- Publication type:
- Article
7
Ge implantation, Bloch wave calculation, ALCHEMI, nanocrystal formation, HRTEM, faulted GeSi nanocrystals.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 251
- By:
- Publication type:
- Article
8
radiation damage, low temperature, cryoprotection, imaging plate, EDS.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 245
- By:
- Publication type:
- Article
9
3D-observation, HAADF-STEM, eucentric specimen stage, double spherical fulcra, cylindrical specimen, FIB, ZnO particle, Cu metallization, 3D-EDX.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 235
- By:
- Publication type:
- Article
10
scanning transmission electron microscopy, Z-contrast, ADF, Bloch waves, thermal diffuse scattering, imaging theory.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 227
- By:
- Publication type:
- Article
11
STEM, EELS, environment, magnetic fields, pressure, atomic resolution.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 219
- By:
- Publication type:
- Article
12
STEMM, EELS, Z-contrast images, defects, Interfaces.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 205
- By:
- Publication type:
- Article
13
decagonal quasicrystal, high-angle annular dark-field imaging, Z-contrast imaging, convergent-beam electron diffraction.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 197
- By:
- Publication type:
- Article
14
atomic-resolution Z-contrast scanning transmission electron microscopy, icosahedral quasicrystals, intermetallic compound.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 187
- By:
- Publication type:
- Article
15
high resolution electron microscopy, scanning transmission electron microscopy, spherical aberration, aberration correction, Ronchigram analysis.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 177
- By:
- Publication type:
- Article
16
auto-tuning, focusing, astigmatism correction, contrast transfer function, HAADF-STEM, Fourier transform.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 163
- By:
- Publication type:
- Article
17
scanning transmission electron microscope, Behte method, multislice method.
- Published in:
- Journal of Electron Microscopy, 2001, v. 50, n. 3, p. 157
- By:
- Publication type:
- Article