Works matching IS 00220744 AND DT 2001 AND VI 50 AND IP 2
1
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 89, doi. 10.1093/jmicro/50.2.89
- Nakata, K;
- Okada, O;
- Ueki, Y
- Article
2
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 83, doi. 10.1093/jmicro/50.2.83
- Terada, S;
- Aoyama, T;
- Yano, F;
- Mitsui, Y
- Article
3
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 97, doi. 10.1093/jmicro/50.2.97
- Article
4
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 101, doi. 10.1093/jmicro/50.2.101
- Terauchi, M;
- Yamamoto, H;
- Tanaka, M
- Article
5
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 105, doi. 10.1093/jmicro/50.2.105
- Konno, J;
- Kawasaki, M;
- Hiraga, K
- Article
6
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 113, doi. 10.1093/jmicro/50.2.113
- Hatano, Y;
- Yoshida, M;
- Uno, F;
- Yoshida, S;
- Osafune, N;
- Ono, K;
- Yamada, M
- Article
7
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 133, doi. 10.1093/jmicro/50.2.133
- Coulary, B;
- Aigle, M;
- Schaeffer, J
- Article
8
- Journal of Electron Microscopy, 2001, v. 50, n. 2, p. 125, doi. 10.1093/jmicro/50.2.125
- Ikebe, T;
- Shimada, T;
- Ina, K;
- Kitamura, H;
- Nakatsuka, K
- Article