Works matching IS 00220744 AND DT 2000 AND VI 49 AND IP 2

Results: 21

The effect of calcium ionophore A23187 on neurites from embryonic mouse spinal cord explants in culture.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 379, doi. 10.1093/oxfordjournals.jmicro.a023818

By:

Bird, M. M.;
Owen, A.

Publication type:

Article

Observation and nucleation control of Genanoislands on Si(111) surfaces using scanning reflection electron microscopy.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 217, doi. 10.1093/oxfordjournals.jmicro.a023801

By:

Shibata, Motoshi;
Shklyaev, Alexander A.;
Ichikawa, Masakazu

Publication type:

Article

Mechanism for secondary electron dopant contrast in the SEM.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 311, doi. 10.1093/oxfordjournals.jmicro.a023811

By:

Sealy, Cordelia P.;
Castell, Martin R.;
Wilshaw, Peter R.

Publication type:

Article

Derivation of growth mechanism of nano–defects in GaN from TEM data.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 339, doi. 10.1093/oxfordjournals.jmicro.a023814

By:

Liliental-Weber, Zuzanna

Publication type:

Article

Reproducibility and applicability of gallium replication as evaluated by biological specimen use.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 371, doi. 10.1093/oxfordjournals.jmicro.a023817

By:

Adachi, Eiki;
Matsubara, Keiko

Publication type:

Article

Direct observation of piezoelectric fields in GaN/InGaN/GaN strained quantum wells.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 281, doi. 10.1093/oxfordjournals.jmicro.a023808

By:

Barnard, J. S.;
Cherns, D.

Publication type:

Article

Advances in SEM–based diffraction studies of defects and strains in semiconductors.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 299, doi. 10.1093/oxfordjournals.jmicro.a023810

By:

Wilkinson, Angus J.

Publication type:

Article

Transloation of slexon the azurophilic granule membrane to the plasma membrane in activated human neutrophils.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 359, doi. 10.1093/oxfordjournals.jmicro.a023816

By:

Suzuki, Hidenori;
Yokimizo, Sanae;
Wakamoto, Shinobu;
Watanabe, Kaori;
Hirose, Kumiko;
Akamatsu, Noriko;
Tanoue, Kenjiro

Publication type:

Article

Studies on the structure of crescent-shaped GaAs quantum wires by combination of electron microscopy and photoluminescence spectroscopy.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 349, doi. 10.1093/oxfordjournals.jmicro.a023815

By:

Matsuhata, Hirofumi;
Wang, Xue-Lun;
Ogura, Mutsuo

Publication type:

Article

Simultaneous STM and UHV electron microscope observation of silicon nanowires extracted from Si(111) surface.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 211, doi. 10.1093/oxfordjournals.jmicro.a023800

By:

Naitoh, Y.;
Takayanagi, K.;
Oshima, Y.;
Hirayama, H.

Publication type:

Article

Gradual tilting of crystallographic orientation and configuration of dislocations in GaN selectively grown by vapour phase epitaxy methods.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 331, doi. 10.1093/oxfordjournals.jmicro.a023813

By:

Kuwano, Noriyuki;
Tsukamoto, Keisuke;
Talki, Wataru;
Horibuchi, Kayo;
Oki, Kensuke;
Kawaguchi, Yasutoshi;
Shibata, Takumi;
Sawaki, Nobuhiko;
Hiramatsu, Kazumasa

Publication type:

Article

Atomic resolution Z–contrast imaging of semiconductors.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 231, doi. 10.1093/oxfordjournals.jmicro.a023803

By:

Xin, Yan;
James, Edward M.;
Browning, Nigel D.;
Pennycook, Steve J.

Publication type:

Article

Control of island formation on silicon surfaces using ultra–high–vacuum scanning electron microscopy.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 225, doi. 10.1093/oxfordjournals.jmicro.a023802

By:

Homma, Yoshikazu;
Finnie, Paul;
Ogino, Toshio

Publication type:

Article

Preface to Recent Developments in the Electron Microscopy of Semiconductors.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 209, doi. 10.1093/oxfordjournals.jmicro.a023799

By:

Takeda, Seiji;
Cherns, David

Publication type:

Article

Dislocation propagation in GaN films formed by epitaxial lateral overgrowth.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 323, doi. 10.1093/oxfordjournals.jmicro.a023812

By:

Sakai, Akira;
Sunakawa, Haruo;
Kimura, Akitaka;
Usui, Akira

Publication type:

Article

Enzyme–histochemical demonstration of lymphatic vessels in the golden hamster periodontium: an attempt to reactivate the 5'–nucleotidase activity with Mg++ ion supply.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 387, doi. 10.1093/oxfordjournals.jmicro.a023819

By:

Nara, Eisuke;
Osawa, Tokuji;
Liang, Jung-Chou;
Wang, Yaoguang;
Nozaka, Yohichiro

Publication type:

Article

Quantitative TEM of point defects in Si.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 293, doi. 10.1093/oxfordjournals.jmicro.a023809

By:

Eaglesham, D. J.;
Venezia, V. C.;
Gossmann, H.-J.;
Agarwal, A.

Publication type:

Article

Near–edge conduction band electronic states in SiGe alloys.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 267, doi. 10.1093/oxfordjournals.jmicro.a023806

By:

Batson, Philip E.

Publication type:

Article

Plasmon–loss imaging of chains of crystalline–silicon nanospheres and silicon nanowires.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 275, doi. 10.1093/oxfordjournals.jmicro.a023807

By:

Kohno, Hideo;
Takeda, Seiji;
Tanaka, Koji

Publication type:

Article

Quantitative HRTEM analysis of semiconductor quantum dots.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 245, doi. 10.1093/oxfordjournals.jmicro.a023804

By:

Tillmann, Karsten;
Jäger, Wolfgang

Publication type:

Article

Fluctuation microscopy: a probe of atomic correlations in disordered materials.

Published in:

Journal of Electron Microscopy, 2000, v. 49, n. 2, p. 259, doi. 10.1093/oxfordjournals.jmicro.a023805

By:

Voyles, P. M.;
Gibson, J. M.;
Treacy, M. M. J.

Publication type:

Article