Works matching IS 00220744 AND DT 1999 AND VI 48 AND IP 5
1
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 665, doi. 10.1093/oxfordjournals.jmicro.a023733
- Tokuji Osawa;
- Yasuo Yoshida;
- Fumio Tsuzuku;
- Momoki Nozaka;
- Minoru Takashio;
- Yohichiro Nozaka
- Article
2
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 659, doi. 10.1093/oxfordjournals.jmicro.a023732
- Akiko Sohn;
- Toshiyuki Kaidoh;
- Takao Inoué
- Article
3
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 653, doi. 10.1093/oxfordjournals.jmicro.a023731
- Teruhisa Hirai;
- Kazuyoshi Murata;
- Kaoru Mitsuoka;
- Yoshiaki Kimura;
- Yoshinori Fujiyoshi
- Article
4
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 637, doi. 10.1093/oxfordjournals.jmicro.a023730
- Masa-aki Teranishi;
- Marius Karbowski;
- Chieko Kurono;
- Tsuyoshi Soji;
- Takashi Wakabayashi1'
- Article
5
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 629, doi. 10.1093/oxfordjournals.jmicro.a023729
- Article
6
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 621, doi. 10.1093/oxfordjournals.jmicro.a023728
- HLroyuki Morioka;
- Kappei Kobayashi;
- Masayoshi Tachibana;
- Jiro Imanishi
- Article
7
- Journal of Electron Microscopy, 1999, v. 48, n. 5, p. 537, doi. 10.1093/oxfordjournals.jmicro.a023713
- Article