Works matching IS 00220744 AND DT 1999 AND VI 48 AND IP 3
1
- Journal of Electron Microscopy, 1999, v. 48, n. 3, p. 297, doi. 10.1093/oxfordjournals.jmicro.a023681
- Sadaaki Oki;
- Junzo Desaki;
- Taichi Ezaki;
- Yoshiro Matsuda
- Article
2
- Journal of Electron Microscopy, 1999, v. 48, n. 3, p. 289, doi. 10.1093/oxfordjournals.jmicro.a023680
- Kei-Ichi Hirai;
- Jiehong Pan;
- Hiroki Shimada;
- Toshikatsu Izuhara;
- Takayuki Kuiihara;
- Keiichi Moriguchi
- Article
3
- Journal of Electron Microscopy, 1999, v. 48, n. 3, p. 277, doi. 10.1093/oxfordjournals.jmicro.a023679
- Ress, David;
- Harlow, Mark L.;
- Schwarz, Mikael;
- Marshall, Robert M.;
- McMahan, Uel J.
- Article
4
- Journal of Electron Microscopy, 1999, v. 48, n. 3, p. 267, doi. 10.1093/oxfordjournals.jmicro.a023678
- Article
5
- Journal of Electron Microscopy, 1999, v. 48, n. 3, p. 261, doi. 10.1093/oxfordjournals.jmicro.a023677
- Article