Works matching IS 00220744 AND DT 1998 AND VI 47 AND IP 5
1
- Journal of Electron Microscopy, 1998, v. 47, n. 5, p. 527, doi. 10.1093/oxfordjournals.jmicro.a023624
- Toshihiro Takizawa;
- Takami Takizawa1';
- Hideaki Iwasaki;
- Takuma Saito
- Article
2
- Journal of Electron Microscopy, 1998, v. 47, n. 5, p. 517, doi. 10.1093/oxfordjournals.jmicro.a023623
- Miho Shimizu;
- Takahisa Sasaki;
- Akira Ishihara;
- Ryoichi Furuya;
- Tadaharu Kawawa
- Article
3
- Journal of Electron Microscopy, 1998, v. 47, n. 5, p. 495, doi. 10.1093/oxfordjournals.jmicro.a023621
- Hosaka, Y.;
- Taguchi, K.;
- Iwamoto, T.;
- Kuroda, K.;
- Tsuruoka, H.;
- Xu, H.;
- Hamaoka, T.
- Article
4
- Journal of Electron Microscopy, 1998, v. 47, n. 5, p. 489, doi. 10.1093/oxfordjournals.jmicro.a023620
- Nobuo Terada;
- Yasuhisa Fujii;
- Yasuko Kato;
- Hideho Ueda;
- Takeshi Baba;
- Shinichi Ohno
- Article
5
- Journal of Electron Microscopy, 1998, v. 47, n. 5, p. 451, doi. 10.1093/oxfordjournals.jmicro.a023616
- Toyoshi Fujimoto;
- Haruo Hagiwara;
- Takeo Aoki;
- Hiroshi Kogo;
- Ryuji Nomura
- Article