Works matching IS 00220744 AND DT 1998 AND VI 47 AND IP 4
1
- Journal of Electron Microscopy, 1998, v. 47, n. 4, p. 359, doi. 10.1093/oxfordjournals.jmicro.a023604
- Boon-Huat Bay;
- Yee-Gek Chan;
- Tuck-Yong Yick;
- Hoo-Kwong Leong
- Article
2
- Journal of Electron Microscopy, 1998, v. 47, n. 4, p. 355, doi. 10.1093/oxfordjournals.jmicro.a023603
- Article
3
- Journal of Electron Microscopy, 1998, v. 47, n. 4, p. 351, doi. 10.1093/oxfordjournals.jmicro.a023602
- Tatsuo Ushiki;
- Hiroya Hashizume;
- Sukehiro Itoh;
- Kenzo Kuboki;
- Syobu Saito;
- Keiichi Tanaka
- Article