Works matching IS 00220744 AND DT 1998 AND VI 47 AND IP 2
1
- Journal of Electron Microscopy, 1998, v. 47, n. 2, p. 175, doi. 10.1093/oxfordjournals.jmicro.a023575
- Article
2
- Journal of Electron Microscopy, 1998, v. 47, n. 2, p. 169, doi. 10.1093/oxfordjournals.jmicro.a023574
- Yasuhiro Hosaka;
- Kazumichi Kuroda;
- Akihiro Ikeura;
- Tsutomu Iwamoto;
- Yasuo Suzuki
- Article
3
- Journal of Electron Microscopy, 1998, v. 47, n. 2, p. 161, doi. 10.1093/oxfordjournals.jmicro.a023573
- Ichiro Tanii;
- Kazuya Yoshinaga;
- Kiyotaka Toshimori
- Article
4
- Journal of Electron Microscopy, 1998, v. 47, n. 2, p. 149
- Schmiedl, Andreas;
- Fehrenbach, Heinz;
- Richter, Joachim
- Article
5
- Journal of Electron Microscopy, 1998, v. 47, n. 2, p. 101, doi. 10.1093/oxfordjournals.jmicro.a023566
- Article