Works matching IS 00220744 AND DT 1997 AND VI 46 AND IP 1

Results: 13

Characteristics of the myelin sheath membrane of the spiral ganglion cell and the cochlear nerve of guinea pig.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 103, doi. 10.1093/oxfordjournals.jmicro.a023485

By:

Tatsuoka, H;
Nagano, T;
Chiba, T

Publication type:

Article

High-resolution electron microscopical observations of initial enamel crystals.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 97, doi. 10.1093/oxfordjournals.jmicro.a023496

By:

Tohda, H;
Yamada, M;
Yamaguchi, Y;
Yanagisawa, T

Publication type:

Article

Scanning electron microscopic study of the cytoplasmic tubules in lamprey chloride cells.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 93, doi. 10.1093/oxfordjournals.jmicro.a023495

By:

Sakurai, T;
Hatae, T;
Ichimura, T;
Ishida, T

Publication type:

Article

New fracture-labelling method: alkaline phosphatase in unstimulated human neutrophils.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 85, doi. 10.1093/oxfordjournals.jmicro.a023494

By:

Takizawa, T;
Saito, T

Publication type:

Article

Development of coincidence transmission electron microscope (II) Observation of coincidence electron microscopic image.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 79, doi. 10.1093/oxfordjournals.jmicro.a023493

By:

Yasuno, M;
Kimura, Y;
Shimizu, R

Publication type:

Article

Helical nanotubes of hexagonal boron nitride.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 75, doi. 10.1093/oxfordjournals.jmicro.a023492

By:

Terauchi, M;
Tanaka, M;
Matsuda, H;
Takeda, M;
Kimura, K

Publication type:

Article

Structure of a stacking fault in the (101) plane of TiO2.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 67, doi. 10.1093/oxfordjournals.jmicro.a023491

By:

Yamada, S;
Tanaka, M

Publication type:

Article

Image contrast of biological materials in high-voltage electron microscopy.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 59, doi. 10.1093/oxfordjournals.jmicro.a023490

By:

Bhakat, P;
Bhattacharya, DK

Publication type:

Article

FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 45, doi. 10.1093/oxfordjournals.jmicro.a023489

By:

Saka, H;
Abe, S

Publication type:

Article

Position dependence of the visibility of a single gold atom in silicon crystals in HAADF-STEM image simulation.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 33, doi. 10.1093/oxfordjournals.jmicro.a023488

By:

Nakamura, K;
Kakibayashi, H;
Kanehori, K;
Tanaka, N

Publication type:

Article

Structure determination of YBCO fluorinated phases by HREM.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 23, doi. 10.1093/oxfordjournals.jmicro.a023487

By:

Van Tendeloo, G;
Lebedev, OI;
Shpanchenko, RV;
Antipov, EV

Publication type:

Article

Multiple beam tilt microscopy for super resolved imaging.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 11, doi. 10.1093/oxfordjournals.jmicro.a023486

By:

Kirkland, AI;
Saxon, WO;
Chand, G

Publication type:

Article

Correction properties of electron mirrors.

Published in:

Journal of Electron Microscopy, 1997, v. 46, n. 1, p. 1, doi. 10.1093/oxfordjournals.jmicro.a023484

By:

Preikszas, D;
Rose, H

Publication type:

Article