Atomic Resolution Electronic Structure in Silicon-Based Semiconductors.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 51, doi. 10.1093/oxfordjournals.jmicro.a023412
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- Publication type:
- Article
Works matching IS 00220744 AND DT 1996 AND VI 45 AND IP 1
Results: 17
1
2
Short-Range Ordered Structure of Ga0.47In0.53 As Studied by Energy-Filtered Electron Diffraction and HREM.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 99, doi. 10.1093/oxfordjournals.jmicro.a023419
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- Article
3
Time-Resolved High-Resolution Electron Microscopy of Surface-Diffusion of Tungsten Atoms on MgO (001) Surfaces.
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- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 113, doi. 10.1093/oxfordjournals.jmicro.a023406
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- Publication type:
- Article
4
Quantitative Analysis of Ordered Structure in Multinary Alloys by the IKL-ALCHEMI Method and Its Application to Ordering Kinetics.
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- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 93, doi. 10.1093/oxfordjournals.jmicro.a023418
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- Publication type:
- Article
5
Electron Holography of Electrostatic Fields.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 27, doi. 10.1093/oxfordjournals.jmicro.a023408
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- Publication type:
- Article
6
Quantitative Electron Microdiffraction.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 19, doi. 10.1093/oxfordjournals.jmicro.a023407
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- Publication type:
- Article
7
Attainable Resolution of Energy-Selecting Image Using High-Voltage Electron Microscope.
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- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 79, doi. 10.1093/oxfordjournals.jmicro.a023416
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- Publication type:
- Article
8
Study of Electron-Irradiation-Induced Defects in GaP by In-situ Optical Spectroscopy in a Transmission Electron Microscope.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 73, doi. 10.1093/oxfordjournals.jmicro.a023415
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- Publication type:
- Article
9
Application of Nano-Diffraction to Local Structure Analysis of Amorphous Pd75Si25 Alloy Thin Films.
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- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 105, doi. 10.1093/oxfordjournals.jmicro.a023404
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- Publication type:
- Article
10
Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 64, doi. 10.1093/oxfordjournals.jmicro.a023414
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- Publication type:
- Article
11
Electron Nanodiffraction: Progress and Prospects.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 3, doi. 10.1093/oxfordjournals.jmicro.a023409
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- Publication type:
- Article
12
Interferometry by Coherent Convergent-Beam Electron Diffraction.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 59, doi. 10.1093/oxfordjournals.jmicro.a023413
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- Publication type:
- Article
13
Recent Advances in Quantitative Convergent Beam Electron Diffraction.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 11, doi. 10.1093/oxfordjournals.jmicro.a023405
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- Article
14
Foreword.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 1, doi. 10.1093/oxfordjournals.jmicro.a023403
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- Publication type:
- Article
15
Slow-Scan CCD Camera Analysis of Electron Diffraction and High-Resolution Micrographs of Zeolite TPA/ZSM-5.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 85, doi. 10.1093/oxfordjournals.jmicro.a023417
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- Publication type:
- Article
16
New Trends in STEM-Based Nano-EELS Analysis.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 44, doi. 10.1093/oxfordjournals.jmicro.a023411
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- Publication type:
- Article
17
High Angle Dark Field STEM for Advanced Materials.
- Published in:
- Journal of Electron Microscopy, 1996, v. 45, n. 1, p. 36, doi. 10.1093/oxfordjournals.jmicro.a023410
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- Publication type:
- Article