Works matching IS 00220655 AND DT 2022 AND VI 59 AND IP 2
1
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 161, doi. 10.1111/jedm.12324
- Puhan, Gautam;
- Kim, Sooyeon
- Article
2
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 137, doi. 10.1111/jedm.12323
- Article
3
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 231, doi. 10.1111/jedm.12322
- Article
4
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 208, doi. 10.1111/jedm.12321
- Liu, Jinghua;
- Becker, Kirk
- Article
5
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 180, doi. 10.1111/jedm.12320
- Jones, Paul;
- Tong, Ye;
- Liu, Jinghua;
- Borglum, Joshua;
- Primoli, Vince
- Article
6
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 251, doi. 10.1111/jedm.12319
- Dorans, Neil J.;
- Haberman, Shelby J.
- Article
7
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 140, doi. 10.1111/jedm.12318
- Baldwin, Peter;
- Clauser, Brian E.
- Article
8
- Journal of Educational Measurement, 2022, v. 59, n. 2, p. 135, doi. 10.1111/jedm.12294
- Article