Works matching IS 00220655 AND DT 2020 AND VI 57 AND IP 3
1
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 373, doi. 10.1111/jedm.12283
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2
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 374, doi. 10.1111/jedm.12282
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3
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 403, doi. 10.1111/jedm.12281
- Article
4
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 386, doi. 10.1111/jedm.12280
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5
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 397, doi. 10.1111/jedm.12279
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6
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 458, doi. 10.1111/jedm.12257
- Liu, Chunyan;
- Kolen, Michael J.
- Article
7
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 405, doi. 10.1111/jedm.12254
- Linden, Wim J.;
- Choi, Seung W.
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8
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 443, doi. 10.1111/jedm.12253
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9
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 371, doi. 10.1111/jedm.12219
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10
- Journal of Educational Measurement, 2020, v. 57, n. 3, p. 423, doi. 10.1111/jedm.12207
- Hong, Seong Eun;
- Monroe, Scott;
- Falk, Carl F.
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