Works matching IS 00220655 AND DT 2020 AND VI 57 AND IP 2
1
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 343, doi. 10.1111/jedm.12252
- Chen, Chia‐Wen;
- Wang, Wen‐Chung;
- Chiu, Ming Ming;
- Ro, Sage
- Article
2
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 370, doi. 10.1111/jedm.12269
- Article
3
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 311, doi. 10.1111/jedm.12251
- Kaufmann, Esther;
- Budescu, David V.
- Article
4
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 185, doi. 10.1111/jedm.12246
- Huelmann, Thorben;
- Debelak, Rudolf;
- Strobl, Carolin
- Article
5
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 255, doi. 10.1111/jedm.12249
- Article
6
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 230, doi. 10.1111/jedm.12248
- Lee, Won‐Chan;
- Kim, Stella Y.;
- Choi, Jiwon;
- Kang, Yujin
- Article
7
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 216, doi. 10.1111/jedm.12247
- Clauser, Brian E.;
- Kane, Michael;
- Clauser, Jerome C.
- Article
8
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 286, doi. 10.1111/jedm.12250
- Kim, Stella Y.;
- Lee, Won‐Chan
- Article
9
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 157, doi. 10.1111/jedm.12218
- Article
10
- Journal of Educational Measurement, 2020, v. 57, n. 2, p. 159, doi. 10.1111/jedm.12245
- Langenfeld, Thomas;
- Thomas, Jay;
- Zhu, Rongchun;
- Morris, Carrie A.
- Article