Works matching IS 00220655 AND DT 2017 AND VI 54 AND IP 3
1
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 263, doi. 10.1111/jedm.12121
- Article
2
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 394, doi. 10.1111/jedm.12149
- Article
3
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 306, doi. 10.1111/jedm.12146
- Shin, Hyo Jeong;
- Wilson, Mark;
- Choi, In‐Hee
- Article
4
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 364, doi. 10.1111/jedm.12148
- Lee, Woo‐yeol;
- Cho, Sun‐Joo
- Article
5
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 333, doi. 10.1111/jedm.12147
- Debeer, Dries;
- Janssen, Rianne;
- Boeck, Paul
- Article
6
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 265, doi. 10.1111/jedm.12144
- Guo, Hongwen;
- Robin, Frederic;
- Dorans, Neil
- Article
7
- Journal of Educational Measurement, 2017, v. 54, n. 3, p. 285, doi. 10.1111/jedm.12145
- Barrett, Michelle D.;
- Linden, Wim J.
- Article