Works matching IS 00220655 AND DT 2017 AND VI 54 AND IP 2
1
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 145, doi. 10.1111/jedm.12138
- Kim, Hyung Jin;
- Brennan, Robert L.;
- Lee, Won‐Chan
- Article
2
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 165, doi. 10.1111/jedm.12139
- Kang, Hyeon‐Ah;
- Zhang, Susu;
- Chang, Hua‐Hua
- Article
3
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 143, doi. 10.1111/jedm.12120
- Article
4
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 184, doi. 10.1111/jedm.12140
- Moses, Tim;
- Kim, YoungKoung
- Article
5
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 200, doi. 10.1111/jedm.12141
- Sinharay, Sandip;
- Duong, Minh Q.;
- Wood, Scott W.
- Article
6
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 218, doi. 10.1111/jedm.12142
- Debeer, Dries;
- Ali, Usama S.;
- Rijn, Peter W.
- Article
7
- Journal of Educational Measurement, 2017, v. 54, n. 2, p. 243, doi. 10.1111/jedm.12143
- Fox, Jean‐Paul;
- Marianti, Sukaesi
- Article