Works matching IS 00220655 AND DT 2016 AND VI 53 AND IP 3
1
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 352, doi. 10.1111/jedm.12112
- Liu, Ou Lydia;
- Liu, Huili;
- Roohr, Katrina Crotts;
- McCaffrey, Daniel F.
- Article
2
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 293, doi. 10.1111/jedm.12113
- Brückner, Sebastian;
- Pellegrino, James W.
- Article
3
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 368, doi. 10.1111/jedm.12114
- Milla, Joniada;
- Martín, Ernesto San;
- Bellegem, Sébastien
- Article
4
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 332, doi. 10.1111/jedm.12115
- Schmidt, Susanne;
- Zlatkin‐Troitschanskaia, Olga;
- Fox, Jean‐Paul
- Article
5
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 313, doi. 10.1111/jedm.12116
- Samudra, Preeti G.;
- Min, Inah;
- Cortina, Kai S.;
- Miller, Kevin F.
- Article
6
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 265, doi. 10.1111/jedm.12117
- Article
7
- 2016
- Zlatkin‐Troitschanskaia, Olga;
- Pant, Hans Anand
- Editorial
8
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 251, doi. 10.1111/jedm.12086
- Article
9
- Journal of Educational Measurement, 2016, v. 53, n. 3, p. 252, doi. 10.1111/jedm.12087
- Article