Works matching IS 00220655 AND DT 2016 AND VI 53 AND IP 1
1
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 1, doi. 10.1111/jedm.12082
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2
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 2, doi. 10.1111/jedm.12083
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3
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 45, doi. 10.1111/jedm.12100
- Wang, Shiyu;
- Lin, Haiyan;
- Chang, Hua‐Hua;
- Douglas, Jeff
- Article
4
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 63, doi. 10.1111/jedm.12101
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5
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 86, doi. 10.1111/jedm.12102
- Wise, Steven L.;
- Kingsbury, G. Gage
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6
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 106, doi. 10.1111/jedm.12103
- Wiberg, Marie;
- González, Jorge
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7
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 126, doi. 10.1111/jedm.12105
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8
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 3, doi. 10.1111/jedm.12098
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9
- Journal of Educational Measurement, 2016, v. 53, n. 1, p. 23, doi. 10.1111/jedm.12099
- Wyse, Adam E.;
- Babcock, Ben
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