Works matching IS 00220655 AND DT 2010 AND VI 47 AND IP 3
1
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 261, doi. 10.1111/j.1745-3984.2010.00113.x
- Sinharay, Sandip;
- Holland, Paul W.
- Article
2
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 286, doi. 10.1111/j.1745-3984.2010.00114.x
- Kim, Sooyeon;
- Livingston, Samuel A.
- Article
3
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 299, doi. 10.1111/j.1745-3984.2010.00115.x
- French, Brian F.;
- Finch, W. Holmes
- Article
4
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 318, doi. 10.1111/j.1745-3984.2010.00116.x
- Kyong Hee Chon;
- Won-Chan Lee;
- Dunbar, Stephen B.
- Article
5
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 339, doi. 10.1111/j.1745-3984.2010.00117.x
- Article
6
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 361, doi. 10.1111/j.1745-3984.2010.00118.x
- Article
7
- Journal of Educational Measurement, 2010, v. 47, n. 3, p. 373, doi. 10.1111/j.1745-3984.2010.00119.x
- Robusto, Egidio;
- Stefanutti, Luca;
- Anselmi, Pasquale
- Article