Works matching IS 00220655 AND DT 2008 AND VI 45 AND IP 4
1
- Journal of Educational Measurement, 2008, v. 45, n. 4, p. 391, doi. 10.1111/j.1745-3984.2008.00071.x
- Taehoon Kang;
- Chen, Troy T.
- Article
2
- Journal of Educational Measurement, 2008, v. 45, n. 4, p. 309, doi. 10.1111/j.1745-3984.2008.00067.x
- Jinghua Liu;
- Low, Albert C.
- Article
3
- Journal of Educational Measurement, 2008, v. 45, n. 4, p. 325, doi. 10.1111/j.1745-3984.2008.00068.x
- Sooyeon Kim;
- Von Davier, Alina A.;
- Haberman, Shelby
- Article
4
- Journal of Educational Measurement, 2008, v. 45, n. 4, p. 343, doi. 10.1111/j.1745-3984.2008.00069.x
- Article
5
- Journal of Educational Measurement, 2008, v. 45, n. 4, p. 363, doi. 10.1111/j.1745-3984.2008.00070.x
- Camilli, Gregory;
- Prowker, Adam;
- Dossey, John A.;
- Lindquist, Mary M.;
- Ting-Wei Chiu;
- Vargas, Sadako;
- De la Torre, Jimmy
- Article
6
- 2008
- Nichols, Paul D.;
- Joldersma, Kevin
- Book Review