Works matching IS 00220655 AND DT 2008 AND VI 45 AND IP 2
1
- Journal of Educational Measurement, 2008, v. 45, n. 2, p. 99, doi. 10.1111/j.1745-3984.2007.00055.x
- Van der Ark, L. Andries;
- Emons, Wilco H. M.;
- Sijtsma, Klaas
- Article
2
- Journal of Educational Measurement, 2008, v. 45, n. 2, p. 119, doi. 10.1111/j.1745-3984.2007.00056.x
- Betebenner, Damian W.;
- Yi Shang;
- Yun Xiang;
- Yan Zhao;
- Xiaohui Yue
- Article
3
- Journal of Educational Measurement, 2008, v. 45, n. 2, p. 139, doi. 10.1111/j.1745-3984.2007.00057.x
- Korobko, Oksana B.;
- Glas, Cees A. W.;
- Bosker, Roel J.;
- Luyten, Johan W.
- Article
4
- Journal of Educational Measurement, 2008, v. 45, n. 2, p. 159, doi. 10.1111/j.1745-3984.2008.00058.x
- De la Torrey, Jimmy;
- Deng, Weiling
- Article
5
- Journal of Educational Measurement, 2008, v. 45, n. 2, p. 179, doi. 10.1111/j.1745-3984.2008.00059.x
- Kim, Seonghoon;
- Feldt, Leonard S.
- Article