Works matching IS 00220655 AND DT 2008 AND VI 45 AND IP 1
1
- Journal of Educational Measurement, 2008, v. 45, n. 1, p. 45, doi. 10.1111/j.1745-3984.2007.00051.x
- Van Nijlen, Daniëel;
- Janssen, Rianne
- Article
2
- Journal of Educational Measurement, 2008, v. 45, n. 1, p. 1, doi. 10.1111/j.1745-3984.2007.00049.x
- Article
3
- Journal of Educational Measurement, 2008, v. 45, n. 1, p. 17, doi. 10.1111/j.1745-3984.2007.00050.x
- Holland, Paul W.;
- Sinharay, Sandip;
- Von Davier, Alina A.;
- Ning Han
- Article
4
- Journal of Educational Measurement, 2008, v. 45, n. 1, p. 65, doi. 10.1111/j.1745-3984.2007.00052.x
- Gierl, Mark J.;
- Yinggan Zheng;
- Ying Cui
- Article