Works matching IS 00220655 AND DT 2005 AND VI 42 AND IP 3
1
- Journal of Educational Measurement, 2005, v. 42, n. 3, p. 223, doi. 10.1111/j.1745-3984.2005.00012.x
- Huitzing, Hiddo A.;
- Veldkamp, Bernard P.;
- Verschoor, Angela J.
- Article
2
- Journal of Educational Measurement, 2005, v. 42, n. 3, p. 245, doi. 10.1111/j.1745-3984.2005.00013.x
- Li, Yuan H.;
- Schafer, William D.
- Article
3
- Journal of Educational Measurement, 2005, v. 42, n. 3, p. 271, doi. 10.1111/j.1745-3984.2005.00014.x
- Wainer, Howard;
- Wang, X. A.;
- Skorupski, William P.;
- Bradlow, Eric T.
- Article
4
- Journal of Educational Measurement, 2005, v. 42, n. 3, p. 283, doi. 10.1111/j.1745-3984.2005.00015.x
- Article