Works matching IS 00218898 AND DT 2024 AND VI 57 AND IP 2
Results: 39
A workflow for single‐particle structure determination via iterative phasing of rotational invariants in fluctuation X‐ray scattering.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 324, doi. 10.1107/S1600576724000992
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DLSIA: Deep Learning for Scientific Image Analysis.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 392, doi. 10.1107/S1600576724001390
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Neural network analysis of neutron and X‐ray reflectivity data incorporating prior knowledge.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 456, doi. 10.1107/S1600576724002115
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Visualizing the fibre texture of satin spar using laboratory 2D X‐ray diffraction.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 240, doi. 10.1107/S1600576724000529
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Crystal structure and elastic and phonon properties of realgar versus pressure.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 220, doi. 10.1107/S1600576724000025
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Refinement of the uranium dispersion corrections from anomalous diffraction.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 284, doi. 10.1107/S1600576723010889
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iRing: a program for two‐dimensional powder diffraction image integration with automatic calibration.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 567, doi. 10.1107/S1600576724001936
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A correction procedure for secondary scattering contributions from windows in small‐angle X‐ray scattering and ultra‐small‐angle X‐ray scattering.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 440, doi. 10.1107/S1600576724001997
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SEB: a computational tool for symbolic derivation of the small‐angle scattering from complex composite structures.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 587, doi. 10.1107/S1600576724001729
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Observations of specimen morphology effects on near‐zone‐axis convergent‐beam electron diffraction patterns.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 351, doi. 10.1107/S1600576724001614
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Dehydroxylation and structural transition in α‐GaOOH investigated by in situ X‐ray diffraction.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 232, doi. 10.1107/S1600576724000050
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Unlocking the surface chemistry of ionic minerals: a high‐throughput pipeline for modeling realistic interfaces.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 503, doi. 10.1107/S1600576724001286
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Robust image descriptor for machine learning based data reduction in serial crystallography.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 413, doi. 10.1107/S160057672400147X
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X‐Ray Calc 3: improved software for simulation and inverse problem solving for X‐ray reflectivity.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 555, doi. 10.1107/S1600576724001031
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Dynamical and kinematical X‐ray diffraction in a bent crystal.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 296, doi. 10.1107/S1600576724001109
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Polarized X‐ray diffraction anomalous near‐edge structure study on the orbital physics of thin WSe<sub>2</sub> layers.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 344, doi. 10.1107/S1600576724001018
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The Pixel Anomaly Detection Tool: a user‐friendly GUI for classifying detector frames using machine‐learning approaches.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 529, doi. 10.1107/S1600576724000116
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Measurements of the geometrical characteristics and refractive index of specimens made with X‐ray interferometers.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 499, doi. 10.1107/S1600576724001742
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Revisiting the hydrogenation behavior of NdGa and its hydride phases.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 248, doi. 10.1107/S1600576724000554
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Simulations of dislocation contrast in dark‐field X‐ray microscopy.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 358, doi. 10.1107/S1600576724001183
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Laue microdiffraction on polycrystalline samples above 1500 K achieved with the QMAX‐µLaue furnace.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 470, doi. 10.1107/S1600576724001821
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PYXIS: an integrated software package for synchrotron micro/nanodiffraction data analysis.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 539, doi. 10.1107/S1600576724000517
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X‐ray diffraction from dislocation half‐loops in epitaxial films.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 276, doi. 10.1107/S160057672400089X
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Millisecond X‐ray reflectometry and neural network analysis: unveiling fast processes in spin coating.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 314, doi. 10.1107/S1600576724001171
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A note on the Hendrickson–Lattman phase probability distribution and its equivalence to the generalized von Mises distribution.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 492, doi. 10.1107/S1600576724000311
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Convolutional neural network approach for the automated identification of in cellulo crystals.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 266, doi. 10.1107/S1600576724000682
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Wetting of alginate aerogels, from mesoporous solids to hydrogels: a small‐angle scattering analysis.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 369, doi. 10.1107/S1600576724001705
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INSIGHT: in situ heuristic tool for the efficient reduction of grazing‐incidence X‐ray scattering data.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 509, doi. 10.1107/S1600576723011159
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iQual: a new computer program for qualitative phase analysis with efficient search–match capability.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 572, doi. 10.1107/S1600576724002267
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FlϵX: a computer vision program to evaluate strain in flexible crystals.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 552, doi. 10.1107/S1600576723008282
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Study of the epitaxy between ϵ‐Fe<sub>2</sub>O<sub>3</sub>, hematite and spinel in brown‐glazed Chinese ceramics using electron diffraction mapping techniques.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 431, doi. 10.1107/S1600576724001493
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A new experimental station for microbeam X‐ray scattering at the SSRF BL10U1 beamline.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 446, doi. 10.1107/S1600576724001948
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Simulation of neutron dark‐field data for grating‐based interferometers.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 403, doi. 10.1107/S1600576724001201
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A high‐temperature high‐pressure small‐angle neutron scattering cell for studying hydrothermal reactions in supercritical water.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 306, doi. 10.1107/S1600576724000700
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X‐ray standing wave characterization of the strong metal–support interaction in Co/TiO<sub>x</sub> model catalysts.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 481, doi. 10.1107/S1600576724001730
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Tripling of the scattering vector range of X‐ray reflectivity on liquid surfaces using a double‐crystal deflector.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 258, doi. 10.1107/S1600576724000657
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FLEXR GUI: a graphical user interface for multi‐conformer modeling of proteins.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 580, doi. 10.1107/S1600576724001523
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From solution to structure: empowering inclusive cryo‐EM with a pre‐characterization pipeline for biological samples.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 602, doi. 10.1107/S1600576724001717
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The multi‐slit very small angle neutron scattering instrument at the China Spallation Neutron Source.
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- Journal of Applied Crystallography, 2024, v. 57, n. 2, p. 380, doi. 10.1107/S1600576724000815
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