Works matching IS 00218898 AND DT 2020 AND VI 53 AND IP 4

Results: 31

Pulse‐to‐pulse wavefront sensing at free‐electron lasers using ptychography.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 949, doi. 10.1107/S1600576720006913

By:

Sala, Simone;
Daurer, Benedikt J.;
Odstrcil, Michal;
Capotondi, Flavio;
Pedersoli, Emanuele;
Hantke, Max F.;
Manfredda, Michele;
Loh, N. Duane;
Thibault, Pierre;
Maia, Filipe R. N. C.

Publication type:

Article

Ptychographic X‐ray speckle tracking with multi‐layer Laue lens systems.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 927, doi. 10.1107/S1600576720006925

By:

Morgan, Andrew J.;
Murray, Kevin T.;
Prasciolu, Mauro;
Fleckenstein, Holger;
Yefanov, Oleksandr;
Villanueva-Perez, Pablo;
Mariani, Valerio;
Domaracky, Martin;
Kuhn, Manuela;
Aplin, Steve;
Mohacsi, Istvan;
Messerschmidt, Marc;
Stachnik, Karolina;
Du, Yang;
Burkhart, Anja;
Meents, Alke;
Nazaretski, Evgeny;
Yan, Hanfei;
Huang, Xiaojing;
Chu, Yong S.

Publication type:

Article

Iterative X‐ray spectroscopic ptychography.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 937, doi. 10.1107/S1600576720006354

By:

Chang, Huibin;
Rong, Ziqin;
Enfedaque, Pablo;
Marchesini, Stefano

Publication type:

Article

Resolving pseudosymmetry in tetragonal ZrO2 using electron backscatter diffraction with a modified dictionary indexing approach.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1060, doi. 10.1107/S160057672000864X

By:

Pang, Edward L.;
Larsen, Peter M.;
Schuh, Christopher A.

Publication type:

Article

EDDIDAT: a graphical user interface for the analysis of energy‐dispersive diffraction data.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1130, doi. 10.1107/S1600576720005506

By:

Apel, Daniel;
Genzel, Martin;
Meixner, Matthias;
Boin, Mirko;
Klaus, Manuela;
Genzel, Christoph

Publication type:

Article

Dark‐field electron holography as a recording of crystal diffraction in real space: a comparative study with high‐resolution X‐ray diffraction for strain analysis of MOSFETs.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 885, doi. 10.1107/S1600576720006020

By:

Boureau, Victor;
Durand, Aurèle;
Gergaud, Patrice;
Le Cunff, Delphine;
Wormington, Matthew;
Rouchon, Denis;
Claverie, Alain;
Benoit, Daniel;
Hÿtch, Martin

Publication type:

Article

A new parafocusing paradigm for X‐ray diffraction.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1073, doi. 10.1107/S1600576720008651

By:

Prokopiou, Danae;
McGovern, James;
Davies, Gareth;
Godber, Simon;
Evans, Paul;
Dicken, Anthony;
Rogers, Keith

Publication type:

Article

Real‐time tracking of the self‐assembled growth of a 3D Ge quantum dot lattice in an alumina matrix.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1029, doi. 10.1107/S1600576720007815

By:

Shaji, Ashin;
Micetic, Maja;
Halahovets, Yuriy;
Nadazdy, Peter;
Matko, Igor;
Jergel, Matej;
Majkova, Eva;
Siffalovic, Peter

Publication type:

Article

Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X‐ray reflection analysis.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1006, doi. 10.1107/S1600576720007803

By:

Aarão-Rodrigues, Lorena;
Isaac, Augusta;
Figueiredo, Roberto B.;
Malachias, Angelo

Publication type:

Article

Effect of 2,4‐dinitrophenol dye doping on tristhioureazinc(II) sulfate single crystals: a potential nonlinear optical material.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 972, doi. 10.1107/S1600576720006585

By:

Durgababu, G.;
Nagaraju, G. J.;
Bhagavannarayana, G.

Publication type:

Article

A new approach to phason disorder for a decagonal quasicrystal: the moment series expansion of the tiling distribution function for AlCuRh.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 904, doi. 10.1107/S1600576720006251

By:

Bugański, Ireneusz;
Strzałka, Radoslaw;
Wolny, Janusz

Publication type:

Article

Chirok: a post‐refinement tool to analyse absolute structure.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1138, doi. 10.1107/S1600576720006214

By:

Dyadkin, Vadim;
Pattison, Philip;
Chernyshov, Dmitry

Publication type:

Article

X‐ray characterization of physical‐vapor‐transport‐grown bulk AlN single crystals.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1080, doi. 10.1107/S1600576720008961

By:

Wicht, Thomas;
Müller, Stephan;
Weingärtner, Roland;
Epelbaum, Boris;
Besendörfer, Sven;
Bläß, Ulrich;
Weisser, Matthias;
Unruh, Tobias;
Meissner, Elke

Publication type:

Article

Viscous‐medium‐based crystal support in a sample holder for fixed‐target serial femtosecond crystallography.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1051, doi. 10.1107/S1600576720008663

By:

Lee, Keondo;
Lee, Donghyeon;
Baek, Sangwon;
Park, Jaehyun;
Lee, Sang Jae;
Park, Sehan;
Chung, Wan Kyun;
Lee, Jong-Lam;
Cho, Hyun-Soo;
Cho, Yunje;
Nam, Ki Hyun

Publication type:

Article

X‐Seed 4: updates to a program for small‐molecule supramolecular crystallography.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1141, doi. 10.1107/S1600576720007438

By:

Barbour, Leonard J.

Publication type:

Article

Predicting the available work from deformation‐induced α′′ martensite formation in metastable β Ti alloys.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1015, doi. 10.1107/S1600576720007451

By:

Niessen, Frank;
Pereloma, Elena V.;
Saleh, Ahmed A.

Publication type:

Article

Crystallography of γ′‐Fe4N formation in single‐crystalline α‐Fe whiskers.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 865, doi. 10.1107/S1600576720005981

By:

Schumann, Helge;
Richter, Gunther;
Leineweber, Andreas

Publication type:

Article

A laboratory transmission diffraction Laue setup to evaluate single‐crystal quality.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 914, doi. 10.1107/S1600576720006317

By:

Arnaud, Alexiane;
Guediche, Wijdène;
Remacha, Clément;
Romero, Edward;
Proudhon, Henry

Publication type:

Article

MrPIXEL: automated execution of Pixel calculations via the Mercury interface.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1154, doi. 10.1107/S1600576720008444

By:

Reeves, Matthew G.;
Wood, Peter A.;
Parsons, Simon

Publication type:

Article

New method to measure domain‐wall motion contribution to piezoelectricity: the case of PbZr0.65Ti0.35O3 ferroelectric.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1039, doi. 10.1107/S1600576720008213

By:

Gorfman, Semën;
Choe, Hyeokmin;
Zhang, Guanjie;
Zhang, Nan;
Yokota, Hiroko;
Glazer, Anthony Michael;
Xie, Yujuan;
Dyadkin, Vadim;
Chernyshov, Dmitry;
Ye, Zuo-Guang

Publication type:

Article

Complex modeling for the quantification of nanoscale disorder using genetic algorithms, density functional theory and line‐profile analysis.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1087, doi. 10.1107/S1600576720008225

By:

Koch, Robert J.;
Li, Guangfang;
Pandey, Shubham;
Phillpot, Simon R.;
Wang, Hui;
Misture, Scott T.

Publication type:

Article

In situ temperature profile measurements with high‐energy X‐rays as a probe of optical floating zone crystal growth environment.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 982, doi. 10.1107/S1600576720007062

By:

Denney, Jonathan J.;
Wang, Yusu;
Corrao, Adam A.;
Huang, Guanglong;
Montiel, David;
Zhong, Hui;
Dooryhee, Eric;
Thornton, Katsuyo;
Khalifah, Peter G.

Publication type:

Article

From atoms to bonds, angles and torsions: molecular metrics from crystal space, and two Excel implementations.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1101, doi. 10.1107/S1600576720007311

By:

Glasser, Leslie

Publication type:

Article

Defining the hematite topotaxial crystal growth in magnetite–hematite phase transformation.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 896, doi. 10.1107/S1600576720006305

By:

Braga de Oliveira, Flávia;
Álvares da Silva, Gilberto;
Graça, Leonardo Martins

Publication type:

Article

In situ monitoring of hydrothermal reactions by X‐ray diffraction with Bragg–Brentano geometry.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1163, doi. 10.1107/S1600576720006019

By:

Mesecke, Karsten;
Malorny, Winfried;
Warr, Laurence N.

Publication type:

Article

Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 880, doi. 10.1107/S1600576720005993

By:

Gradwohl, Kevin-P.;
Danilewsky, Andreas N.;
Roder, Melissa;
Schmidbauer, Martin;
Janicskó-Csáthy, József;
Gybin, Alexander;
Abrosimov, Nikolay;
Sumathi, R. Radhakrishnan

Publication type:

Article

Assessment of structure factors for analysis of small‐angle scattering data from desired or undesired aggregates.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 991, doi. 10.1107/S1600576720006500

By:

Larsen, Andreas Haahr;
Pedersen, Jan Skov;
Arleth, Lise

Publication type:

Article

GIWAXS‐SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing‐incidence wide‐angle X‐ray scattering of organic materials.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1108, doi. 10.1107/S1600576720005476

By:

Savikhin, Victoria;
Steinrück, Hans-Georg;
Liang, Ru-Ze;
Collins, Brian A.;
Oosterhout, Stefan D.;
Beaujuge, Pierre M.;
Toney, Michael F.

Publication type:

Article

Professor Dr Dirk Feil (1933–2020).

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1167, doi. 10.1107/S1600576720008080

By:

Moss, Grant;
Moss, Barbara

Publication type:

Article

SAS‐cam: a program for automatic processing and analysis of small‐angle scattering data.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 1147, doi. 10.1107/S1600576720008985

By:

Wu, Hongjin;
Li, Yiwen;
Liu, Guangfeng;
Liu, Haiguang;
Li, Na

Publication type:

Article

PtyNAMi: ptychographic nano‐analytical microscope.

Published in:

Journal of Applied Crystallography, 2020, v. 53, n. 4, p. 957, doi. 10.1107/S1600576720008420

By:

Schropp, Andreas;
Döhrmann, Ralph;
Botta, Stephan;
Brückner, Dennis;
Kahnt, Maik;
Lyubomirskiy, Mikhail;
Ossig, Christina;
Scholz, Maria;
Seyrich, Martin;
Stuckelberger, Michael E.;
Wiljes, Patrik;
Wittwer, Felix;
Garrevoet, Jan;
Falkenberg, Gerald;
Fam, Yakub;
Sheppard, Thomas L.;
Grunwaldt, Jan-Dierk;
Schroer, Christian G.

Publication type:

Article

Works matching IS 00218898 AND DT 2020 AND VI 53 AND IP 4

Pulse‐to‐pulse wavefront sensing at free‐electron lasers using ptychography.

Ptychographic X‐ray speckle tracking with multi‐layer Laue lens systems.

Iterative X‐ray spectroscopic ptychography.

Resolving pseudosymmetry in tetragonal ZrO<sub>2</sub> using electron backscatter diffraction with a modified dictionary indexing approach.

EDDIDAT: a graphical user interface for the analysis of energy‐dispersive diffraction data.

Dark‐field electron holography as a recording of crystal diffraction in real space: a comparative study with high‐resolution X‐ray diffraction for strain analysis of MOSFETs.

A new parafocusing paradigm for X‐ray diffraction.

Real‐time tracking of the self‐assembled growth of a 3D Ge quantum dot lattice in an alumina matrix.

Retrieving the configuration of grain boundary structure in polycrystalline materials by extraordinary X‐ray reflection analysis.

Effect of 2,4‐dinitrophenol dye doping on tristhioureazinc(II) sulfate single crystals: a potential nonlinear optical material.

A new approach to phason disorder for a decagonal quasicrystal: the moment series expansion of the tiling distribution function for AlCuRh.

Chirok: a post‐refinement tool to analyse absolute structure.

X‐ray characterization of physical‐vapor‐transport‐grown bulk AlN single crystals.

Viscous‐medium‐based crystal support in a sample holder for fixed‐target serial femtosecond crystallography.

X‐Seed 4: updates to a program for small‐molecule supramolecular crystallography.

Predicting the available work from deformation‐induced α′′ martensite formation in metastable β Ti alloys.

Crystallography of γ′‐Fe<sub>4</sub>N formation in single‐crystalline α‐Fe whiskers.

A laboratory transmission diffraction Laue setup to evaluate single‐crystal quality.

MrPIXEL: automated execution of Pixel calculations via the Mercury interface.

New method to measure domain‐wall motion contribution to piezoelectricity: the case of PbZr<sub>0.65</sub>Ti<sub>0.35</sub>O<sub>3</sub> ferroelectric.

Complex modeling for the quantification of nanoscale disorder using genetic algorithms, density functional theory and line‐profile analysis.

In situ temperature profile measurements with high‐energy X‐rays as a probe of optical floating zone crystal growth environment.

From atoms to bonds, angles and torsions: molecular metrics from crystal space, and two Excel implementations.

Defining the hematite topotaxial crystal growth in magnetite–hematite phase transformation.

In situ monitoring of hydrothermal reactions by X‐ray diffraction with Bragg–Brentano geometry.

Dynamical X‐ray diffraction imaging of voids in dislocation‐free high‐purity germanium single crystals.

Assessment of structure factors for analysis of small‐angle scattering data from desired or undesired aggregates.

GIWAXS‐SIIRkit: scattering intensity, indexing and refraction calculation toolkit for grazing‐incidence wide‐angle X‐ray scattering of organic materials.

Professor Dr Dirk Feil (1933–2020).

SAS‐cam: a program for automatic processing and analysis of small‐angle scattering data.

PtyNAMi: ptychographic nano‐analytical microscope.