Works matching IS 00218898 AND DT 2018 AND VI 51 AND IP 6


Results: 29
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    X‐ray topo‐tomography studies of linear dislocations in silicon single crystals.

    Published in:
    Journal of Applied Crystallography, 2018, v. 51, n. 6, p. 1616, doi. 10.1107/S160057671801419X
    By:
    • Asadchikov, Victor;
    • Buzmakov, Alexey;
    • Chukhovskii, Felix;
    • Dyachkova, Irina;
    • Zolotov, Denis;
    • Danilewsky, Andreas;
    • Baumbach, Tilo;
    • Bode, Simon;
    • Haaga, Simon;
    • Hänschke, Daniel;
    • Kabukcuoglu, Merve;
    • Balzer, Matthias;
    • Caselle, Michele;
    • Suvorov, Ernest
    Publication type:
    Article
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    Whole powder pattern modelling macros for TOPAS.

    Published in:
    Journal of Applied Crystallography, 2018, v. 51, n. 6, p. 1752, doi. 10.1107/S160057671801289X
    By:
    • Scardi, Paolo;
    • Azanza Ricardo, Cristy L.;
    • Perez-Demydenko, Camilo;
    • Coelho, Alan A.
    Publication type:
    Article
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