Works matching IS 00218898 AND DT 2018 AND VI 51 AND IP 5

Results: 28

Serial electron crystallography for structure determination and phase analysis of nanocrystalline materials.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1262, doi. 10.1107/S1600576718009500

By:

Smeets, Stef;
Zou, Xiaodong;
Wan, Wei

Publication type:

Article

The Scientific Method: Reflections from a Practitioner. By Massimiliano di Ventra. Oxford University Press, 2018. Pp. 128. Price GBP 13.99. ISBN 9780198825623.

Published in:

2018

By:

Helliwell, John R.

Publication type:

Book Review

Structure of crystallized particles in sputter‐deposited amorphous germanium films.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1467, doi. 10.1107/S1600576718012153

By:

Okugawa, Masayuki;
Nakamura, Ryusuke;
Hirata, Akihiko;
Ishimaru, Manabu;
Yasuda, Hidehiro;
Numakura, Hiroshi

Publication type:

Article

Stacking faults in β‐Ga2O3 crystals observed by X‐ray topography.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1372, doi. 10.1107/S1600576718011093

By:

Yamaguchi, Hirotaka;
Kuramata, Akito

Publication type:

Article

Influence of crystal structure defects on the small‐angle neutron scattering/diffraction patterns of clay‐rich porous media.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1311, doi. 10.1107/S160057671801052X

By:

Ferrage, Eric;
Hubert, Fabien;
Baronnet, Alain;
Grauby, Olivier;
Tertre, Emmanuel;
Delville, Alfred;
Bihannic, Isabelle;
Prêt, Dimitri;
Michot, Laurent J.;
Levitz, Pierre

Publication type:

Article

Effects of multiple scattering encountered for various small‐angle scattering model functions.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1455, doi. 10.1107/S1600576718010816

By:

Jensen, Grethe Vestergaard;
Barker, John George

Publication type:

Article

Probing the intrinsic and extrinsic origins of piezoelectricity in lead zirconate titanate single crystals.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1396, doi. 10.1107/S1600576718011317

By:

Zhang, Nan;
Gorfman, Semën;
Choe, Hyeokmin;
Vergentev, Tikhon;
Dyadkin, Vadim;
Yokota, Hiroko;
Chernyshov, Dmitry;
Wang, Bixia;
Glazer, Anthony Michael;
Ren, Wei;
Ye, Zuo-Guang

Publication type:

Article

A fast X‐ray‐diffraction‐based method for the determination of crystal size distributions (FXD‐CSD).

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1352, doi. 10.1107/S1600576718010567

By:

Neher, Sigmund H.;
Klein, Helmut;
Kuhs, Werner F.

Publication type:

Article

Complete structural and strain analysis of single GaAs/(In,Ga)As/GaAs core–shell–shell nanowires by means of in‐plane and out‐of‐plane X‐ray nanodiffraction.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1387, doi. 10.1107/S1600576718011287

By:

Al Hassan, Ali;
Davtyan, Arman;
Küpers, Hanno;
Lewis, Ryan B.;
Bahrami, Danial;
Bertram, Florian;
Bussone, Genziana;
Richter, Carsten;
Geelhaar, Lutz;
Pietsch, Ullrich

Publication type:

Article

Data‐reduction procedure for correction of geometric factors in the analysis of specular X‐ray reflectivity of small samples.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1295, doi. 10.1107/S1600576718010579

By:

Das, Arijeet;
Singh, Shreyashkar Dev;
Choudhari, R. J.;
Rai, S. K.;
Ganguli, Tapas

Publication type:

Article

Local distortion and octahedral tilting in BaCexTi1−xO3 perovskite.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1283, doi. 10.1107/S1600576718010786

By:

Confalonieri, Giorgia;
Buscaglia, Vincenzo;
Capitani, GianCarlo;
Canu, Giovanna;
Rotiroti, Nicola;
Bernasconi, Andrea;
Pavese, Alessandro;
Dapiaggi, Monica

Publication type:

Article

Time‐resolved X‐ray absorption spectroscopy on Al–Cu alloys – from solute copper to stable precipitates.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1339, doi. 10.1107/S1600576718011214

By:

Petschke, Danny;
Lotter, Frank;
Bläss, Elischa;
Staab, Torsten E. M.

Publication type:

Article

reductus: a stateless Python data reduction service with a browser front end.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1500, doi. 10.1107/S1600576718011974

By:

Maranville, Brian;
Ratcliff II, William;
Kienzle, Paul

Publication type:

Article

xINTERPDF: a graphical user interface for analyzing intermolecular pair distribution functions of organic compounds from X‐ray total scattering data.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1498, doi. 10.1107/S1600576718012359

By:

Shi, Chenyang

Publication type:

Article

Glassy carbon, NIST Standard Reference Material (SRM 3600): hydrogen content, neutron vibrational density of states and heat capacity.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1323, doi. 10.1107/S1600576718010828

By:

Cappelletti, Ronald L.;
Udovic, Terrence J.;
Li, Hui;
Paul, Rick L.

Publication type:

Article

Reciprocal space mapping and strain scanning using X‐ray diffraction microscopy.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1428, doi. 10.1107/S1600576718011378

By:

Poulsen, H. F.;
Cook, P. K.;
Leemreize, H.;
Pedersen, A. F.;
Yildirim, C.;
Kutsal, M.;
Jakobsen, A. C.;
Trujillo, J. X.;
Ormstrup, J.;
Detlefs, C.

Publication type:

Article

PDFgetN3: atomic pair distribution functions from neutron powder diffraction data using ad hoc corrections.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1492, doi. 10.1107/S1600576718010002

By:

Juhás, Pavol;
Louwen, Jaap N.;
van Eijck, Lambert;
Vogt, Eelco T. C.;
Billinge, Simon J. L.

Publication type:

Article

On physical scattering density fluctuations of amorphous samples.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1404, doi. 10.1107/S1600576718011330

By:

Ciccariello, Salvino;
Riello, Piero;
Benedetti, Alvise

Publication type:

Article

X‐ray measurement of triaxial residual stress on machined surfaces by the cosα method using a two‐dimensional detector.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1329, doi. 10.1107/S1600576718011056

By:

Tanaka, Keisuke

Publication type:

Article

Real‐time study of transients during high‐temperature creep of an Ni‐base superalloy by far‐field high‐energy synchrotron X‐ray diffraction.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1274, doi. 10.1107/S1600576718010014

By:

Tréhorel, Roxane;
Ribarik, Gabor;
Schenk, Thomas;
Jacques, Alain

Publication type:

Article

Differential evolution and Markov chain Monte Carlo analyses of layer disorder in nanosheet ensembles using total scattering.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1437, doi. 10.1107/S1600576718011597

By:

Metz, Peter C.;
Koch, Robert;
Misture, Scott T.

Publication type:

Article

Nanodomains and local structure in ternary alkaline‐earth hexaborides.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1445, doi. 10.1107/S1600576718012657

By:

Koch, Robert;
Metz, Peter C.;
Jaime, Oscar;
Vargas-Consuelos, C. Ingram;
Borja-Urby, Raúl;
Ko, J. Y. Peter;
Cahill, James T.;
Edwards, Doreen;
Vasquez, Victor R.;
Graeve, Olivia A.;
Misture, Scott T.

Publication type:

Article

Operando powder X‐ray diffraction study of P2‐NaxNi0.3Mn0.7O2 cathode material during electrochemical cycling.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1304, doi. 10.1107/S1600576718010531

By:

Kjeldgaard, Solveig;
Birgisson, Steinar;
Kielland, Anette Gert;
Iversen, Bo Brummerstedt

Publication type:

Article

Crystallographic shelves: space‐group hierarchy explained.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1481, doi. 10.1107/S1600576718012724

By:

Nespolo, Massimo;
Aroyo, Mois Ilia;
Souvignier, Bernd

Publication type:

Article

Crystal growth, a research‐driven laboratory course.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1474, doi. 10.1107/S1600576718009573

By:

Whelan, Jamie;
Koussa, Joseph;
Chehade, Ibrahim;
Sabanovic, Merima;
Chang, Adrienne;
Carelli, Daniel;
An, Zhihua;
Zhang, Lu;
Bernstein, Joel;
Rabeh, Wael M.

Publication type:

Article

Model‐free classification of X‐ray scattering signals applied to image segmentation.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1378, doi. 10.1107/S1600576718011032

By:

Lutz-Bueno, V.;
Arboleda, C.;
Leu, L.;
Blunt, M. J.;
Busch, A.;
Georgiadis, A.;
Bertier, P.;
Schmatz, J.;
Varga, Z.;
Villanueva-Perez, P.;
Wang, Z.;
Lebugle, M.;
David, C.;
Stampanoni, M.;
Diaz, A.;
Guizar-Sicairos, M.;
Menzel, A.

Publication type:

Article

José Lima‐de‐Faria (1925–2018).

Published in:

2018

By:

Ferraris, Giovanni

Publication type:

Obituary

Calibration of rotation axes for multi‐axis goniometers in macromolecular crystallography.

Published in:

Journal of Applied Crystallography, 2018, v. 51, n. 5, p. 1421, doi. 10.1107/S1600576718010956

By:

White, K. Ian;
Bugris, Valeria;
McCarthy, Andrew A.;
Ravelli, Raimond B. G.;
Csankó, Krisztián;
Cassetta, Alberto;
Brockhauser, Sandor

Publication type:

Article

Works matching IS 00218898 AND DT 2018 AND VI 51 AND IP 5

Serial electron crystallography for structure determination and phase analysis of nanocrystalline materials.

The Scientific Method: Reflections from a Practitioner. By Massimiliano di Ventra. Oxford University Press, 2018. Pp. 128. Price GBP 13.99. ISBN 9780198825623.

Structure of crystallized particles in sputter‐deposited amorphous germanium films.

Stacking faults in β‐Ga<sub>2</sub>O<sub>3</sub> crystals observed by X‐ray topography.

Influence of crystal structure defects on the small‐angle neutron scattering/diffraction patterns of clay‐rich porous media.

Effects of multiple scattering encountered for various small‐angle scattering model functions.

Probing the intrinsic and extrinsic origins of piezoelectricity in lead zirconate titanate single crystals.

A fast X‐ray‐diffraction‐based method for the determination of crystal size distributions (FXD‐CSD).

Complete structural and strain analysis of single GaAs/(In,Ga)As/GaAs core–shell–shell nanowires by means of in‐plane and out‐of‐plane X‐ray nanodiffraction.

Data‐reduction procedure for correction of geometric factors in the analysis of specular X‐ray reflectivity of small samples.

Local distortion and octahedral tilting in BaCe<sub>x</sub>Ti<sub>1−x</sub>O<sub>3</sub> perovskite.

Time‐resolved X‐ray absorption spectroscopy on Al–Cu alloys – from solute copper to stable precipitates.

reductus: a stateless Python data reduction service with a browser front end.

xINTERPDF: a graphical user interface for analyzing intermolecular pair distribution functions of organic compounds from X‐ray total scattering data.

Glassy carbon, NIST Standard Reference Material (SRM 3600): hydrogen content, neutron vibrational density of states and heat capacity.

Reciprocal space mapping and strain scanning using X‐ray diffraction microscopy.

PDFgetN3: atomic pair distribution functions from neutron powder diffraction data using ad hoc corrections.

On physical scattering density fluctuations of amorphous samples.

X‐ray measurement of triaxial residual stress on machined surfaces by the cosα method using a two‐dimensional detector.

Real‐time study of transients during high‐temperature creep of an Ni‐base superalloy by far‐field high‐energy synchrotron X‐ray diffraction.

Differential evolution and Markov chain Monte Carlo analyses of layer disorder in nanosheet ensembles using total scattering.

Nanodomains and local structure in ternary alkaline‐earth hexaborides.

Operando powder X‐ray diffraction study of P2‐Na<sub>x</sub>Ni<sub>0.3</sub>Mn<sub>0.7</sub>O<sub>2</sub> cathode material during electrochemical cycling.

Crystallographic shelves: space‐group hierarchy explained.

Crystal growth, a research‐driven laboratory course.

Model‐free classification of X‐ray scattering signals applied to image segmentation.

José Lima‐de‐Faria (1925–2018).

Calibration of rotation axes for multi‐axis goniometers in macromolecular crystallography.