Works matching IS 00218898 AND DT 2015 AND VI 48 AND IP 4


Results: 40
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    In situ X-ray diffraction environments for high-pressure reactions.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 4, p. 1234, doi. 10.1107/S1600576715011735
    By:
    • Hansen, Bjarne R. S.;
    • Møller, Kasper T.;
    • Paskevicius, Mark;
    • Dippel, Ann-Christin;
    • Walter, Peter;
    • Webb, Colin James;
    • Pistidda, Claudio;
    • Bergemann, Nils;
    • Dornheim, Martin;
    • Klassen, Thomas;
    • Jørgensen, Jens-Erik;
    • Jensen, Torben René
    Publication type:
    Article
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    X-ray diffraction by phase diffraction gratings.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 4, p. 1159, doi. 10.1107/S1600576715011607
    By:
    • Irzhak, D. V.;
    • Knyasev, M. A.;
    • Punegov, V. I.;
    • Roshchupkin, D. V.
    Publication type:
    Article
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    Low- Z polymer sample supports for fixed-target serial femtosecond X-ray crystallography.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 4, p. 1072, doi. 10.1107/S1600576715010493
    By:
    • Feld, Geoffrey K.;
    • Heymann, Michael;
    • Benner, W. Henry;
    • Pardini, Tommaso;
    • Tsai, Ching-Ju;
    • Boutet, Sébastien;
    • Coleman, Matthew A.;
    • Hunter, Mark S.;
    • Li, Xiaodan;
    • Messerschmidt, Marc;
    • Opathalage, Achini;
    • Pedrini, Bill;
    • Williams, Garth J.;
    • Krantz, Bryan A.;
    • Fraden, Seth;
    • Hau-Riege, Stefan;
    • Evans, James E.;
    • Segelke, Brent W.;
    • Frank, Matthias
    Publication type:
    Article
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