Works matching IS 00218898 AND DT 2015 AND VI 48 AND IP 1
Results: 43
Laboratory implementation of X-ray diffraction/scattering computed tomography.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 159, doi. 10.1107/S1600576714027204
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Investigating time-of-flight spin-echo modulation for small-angle neutron scattering through experiments and simulation.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 92, doi. 10.1107/S1600576714025916
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Computing stoichiometric molecular composition from crystal structures.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 85, doi. 10.1107/S1600576714025904
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Calibration and data collection protocols for reliable lattice parameter values in electron pair distribution function studies.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 244, doi. 10.1107/S1600576715000412
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Modelling pair distribution functions (PDFs) of organic compounds: describing both intra- and intermolecular correlation functions in calculated PDFs.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 171, doi. 10.1107/S1600576714026454
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KWS-1 high-resolution small-angle neutron scattering instrument at JCNS: current state.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 61, doi. 10.1107/S1600576714025977
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Crystalline characteristics and superconducting properties of Bi2212 thin films prepared by the Pechini sol-gel method: the effect of different substrates on the film growth.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 37, doi. 10.1107/S1600576714025175
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Structure and stacking order in crystals of asymmetric dumbbell-like colloids.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 238, doi. 10.1107/S1600576714028222
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In situ bending of an Au nanowire monitored by micro Laue diffraction.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 291, doi. 10.1107/S1600576715001107
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High-efficiency diffraction and focusing of X-rays through asymmetric bent crystalline planes.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 297, doi. 10.1107/S1600576714024960
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Determining the Bravais lattice using a single electron backscatter diffraction pattern.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 107, doi. 10.1107/S1600576714025989
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Mechanism of preferential nucleation of [ ]-oriented GaN twins on an SiO<sub>2</sub>-patterned m-plane sapphire substrate.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 195, doi. 10.1107/S1600576714027873
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Elastic macro strain and stress determination by powder diffraction: spherical harmonics analysis starting from the Voigt model. Corrigenda.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 311, doi. 10.1107/S1600576714026673
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Special directions in momentum space. III. Practical applications.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 11, doi. 10.1107/S1600576714024121
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Comparison of silver and molybdenum microfocus X-ray sources for single-crystal structure determination.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 3, doi. 10.1107/S1600576714022985
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A microfabricated fixed path length silicon sample holder improves background subtraction for cryoSAXS.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 227, doi. 10.1107/S1600576714027782
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Ultra-small-angle X-ray scattering study of second-phase particles in heat-treated Zircaloy-4.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 52, doi. 10.1107/S1600576714024893
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Nanoparticle characterization by continuous contrast variation in small-angle X-ray scattering with a solvent density gradient.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 20, doi. 10.1107/S1600576714024455
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Diffuse X-ray scattering from ion-irradiated materials: a parallel-computing approach.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 252, doi. 10.1107/S1600576715000631
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Neutron Laue diffraction study of the complex low-temperature magnetic behaviour of brownmillerite-type Ca<sub>2</sub>Fe<sub>2</sub>O<sub>5</sub>.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 273, doi. 10.1107/S1600576714027976
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Real structure of Ge<sub>4</sub>Bi<sub>2</sub>Te<sub>7</sub>: refinement on diffuse scattering data with the 3D-ΔPDF method.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 200, doi. 10.1107/S1600576714027824
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Beyond the International Year of Crystallography.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 1, doi. 10.1107/S1600576715000916
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An optical chopper for generation of short X-ray pulses to allow in-house time-resolved photocrystallography. Corrigendum.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 310, doi. 10.1107/S1600576714026764
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Design study of a Laue lens for nuclear medicine.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 125, doi. 10.1107/S1600576714026235
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Towards neutron scattering experiments with sub-millisecond time resolution.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 220, doi. 10.1107/S1600576714027848
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EBSD analysis of rhombohedral twinning in hematite crystals of naturally deformed iron formations.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 212, doi. 10.1107/S1600576714025928
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Towards multi-order hard X-ray imaging with multilayer zone plates.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 116, doi. 10.1107/S1600576714026016
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A new parallel and GPU version of a TREOR-based algorithm for indexing powder diffraction data.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 166, doi. 10.1107/S1600576714026466
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Electron diffraction patterns from scroll nanotubes: interpretation peculiarities.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 29, doi. 10.1107/S1600576714024005
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Use of radial symmetry for the calculation of cylindrical absorption coefficients and optimal capillary loadings.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 149, doi. 10.1107/S1600576714026569
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Interpretation of two-dimensional real-space functions obtained from small-angle scattering data of oriented microstructures.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 44, doi. 10.1107/S1600576714024972
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A generalized geometric approach to anisotropic peak broadening due to domain morphology.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 189, doi. 10.1107/S1600576714026557
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Crystal structure determination and refinement via SIR2014.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 306, doi. 10.1107/S1600576715001132
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Full-field energy-dispersive powder diffraction imaging using laboratory X-rays.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 269, doi. 10.1107/S1600576715000801
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An in situ powder diffraction cell for high-pressure hydrogenation experiments using laboratory X-ray diffractometers.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 79, doi. 10.1107/S1600576714025692
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The NeXus data format.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 301, doi. 10.1107/S1600576714027575
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Structural and microstructural interpretations of Zn-doped biocompatible bone-like carbonated hydroxyapatite synthesized by mechanical alloying.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 138, doi. 10.1107/S1600576714026119
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A custom battery for operando neutron powder diffraction studies of electrode structure.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 280, doi. 10.1107/S1600576715000679
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Crystallographic analysis of slip transfer mechanisms across the ferrite/cementite interface in carbon steels with fine lamellar structure.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 97, doi. 10.1107/S1600576714026107
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X-ray diffraction grazing-incidence methods applied for gradient-free residual stress profile measurements in electrodeposited Ni coatings.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 71, doi. 10.1107/S1600576714025722
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Ferroelasticity of SrCo<sub>0.8</sub>Fe<sub>0.2</sub>O<sub>3-δ</sub> perovskite-related oxide with mixed ion-electron conductivity.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 179, doi. 10.1107/S1600576714027770
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Structural investigations of the α<sub>12</sub> Si-Ge superstructure.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 262, doi. 10.1107/S1600576715000849
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An X-ray diffractometer using mirage diffraction. Erratum.
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- Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 312, doi. 10.1107/S1600576714026028
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