Works matching IS 00218898 AND DT 2015 AND VI 48 AND IP 1


Results: 43
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    In situ bending of an Au nanowire monitored by micro Laue diffraction.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 291, doi. 10.1107/S1600576715001107
    By:
    • Leclere, Cédric;
    • Cornelius, Thomas W.;
    • Ren, Zhe;
    • Davydok, Anton;
    • Micha, Jean-Sébastien;
    • Robach, Odile;
    • Richter, Gunther;
    • Belliard, Laurent;
    • Thomas, Olivier
    Publication type:
    Article
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    KWS-1 high-resolution small-angle neutron scattering instrument at JCNS: current state.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 61, doi. 10.1107/S1600576714025977
    By:
    • Feoktystov, Artem V.;
    • Frielinghaus, Henrich;
    • Di, Zhenyu;
    • Jaksch, Sebastian;
    • Pipich, Vitaliy;
    • Appavou, Marie-Sousai;
    • Babcock, Earl;
    • Hanslik, Romuald;
    • Engels, Ralf;
    • Kemmerling, Günther;
    • Kleines, Harald;
    • Ioffe, Alexander;
    • Richter, Dieter;
    • Brückel, Thomas
    Publication type:
    Article
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    Design study of a Laue lens for nuclear medicine.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 125, doi. 10.1107/S1600576714026235
    By:
    • Paternò, Gianfranco;
    • Bellucci, Valerio;
    • Camattari, Riccardo;
    • Guidi, Vincenzo
    Publication type:
    Article
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    Crystal structure determination and refinement via SIR2014.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 306, doi. 10.1107/S1600576715001132
    By:
    • Burla, Maria Cristina;
    • Caliandro, Rocco;
    • Carrozzini, Benedetta;
    • Cascarano, Giovanni Luca;
    • Cuocci, Corrado;
    • Giacovazzo, Carmelo;
    • Mallamo, Mariarosaria;
    • Mazzone, Annamaria;
    • Polidori, Giampiero
    Publication type:
    Article
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    The NeXus data format.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 301, doi. 10.1107/S1600576714027575
    By:
    • Könnecke, Mark;
    • Akeroyd, Frederick A.;
    • Bernstein, Herbert J.;
    • Brewster, Aaron S.;
    • Campbell, Stuart I.;
    • Clausen, Björn;
    • Cottrell, Stephen;
    • Hoffmann, Jens Uwe;
    • Jemian, Pete R.;
    • Männicke, David;
    • Osborn, Raymond;
    • Peterson, Peter F.;
    • Richter, Tobias;
    • Suzuki, Jiro;
    • Watts, Benjamin;
    • Wintersberger, Eugen;
    • Wuttke, Joachim
    Publication type:
    Article
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    Structural investigations of the α<sub>12</sub> Si-Ge superstructure.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 262, doi. 10.1107/S1600576715000849
    By:
    • Etzelstorfer, Tanja;
    • Ahmadpor Monazam, Mohammad Reza;
    • Cecchi, Stefano;
    • Kriegner, Dominik;
    • Chrastina, Daniel;
    • Gatti, Eleonora;
    • Grilli, Emanuele;
    • Rosemann, Nils;
    • Chatterjee, Sangam;
    • Holý, Vaclav;
    • Pezzoli, Fabio;
    • Isella, Giovanni;
    • Stangl, Julian
    Publication type:
    Article
    43

    An X-ray diffractometer using mirage diffraction. Erratum.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 1, p. 312, doi. 10.1107/S1600576714026028
    By:
    • Fukamachi, Tomoe;
    • Jongsukswat, Sukswat;
    • Ju, Dongying;
    • Negishi, Riichirou;
    • Hirano, Keiichi;
    • Kawamura, Takaaki
    Publication type:
    Article