Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 6

Results: 23

crystallographers.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1450

By:

Prodan, Albert

Publication type:

Article

Response to Larsen & Thorkildsen's comments on Extinction-corrected mean thickness and integrated width used in the program UMWEG98.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1448, doi. 10.1107/S0021889800010992

By:

Rossmanith, E.

Publication type:

Article

Comments on Extinction-corrected mean thickness and integral width used in the program UMWEG98 by Rossmanith (2000).

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1447, doi. 10.1107/S0021889800010980

By:

Larsen, Helge B.;
Thorkildsen, Gunnar

Publication type:

Article

Molsee: a Tcl/Tk-based program to control Rasmol.

Published in:

2000

By:

Fenglou Mao;
Luhua Lai

Publication type:

Product Review

OVIONE: a new vector-search rotation-function program for macromolecular crystallography.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1436

By:

Alvarez-Rua, Carmen;
Borge, Javier;
Garcia-Granda, Santiago

Publication type:

Article

Preferred orientation in Debye-Scherrer geometry: interpretation of the March coefficient.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1434, doi. 10.1107/S0021889800012267

By:

Howard, C.J.;
Kisi, E.H.

Publication type:

Article

Quantitative X-ray standing-wave phase analysis by means of photoelectrons.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1430, doi. 10.1107/S0021889800012036

By:

Mukhamedzhanov, E. Kh.;
Bocchi, C.

Publication type:

Article

Electric-field-induced structural changes measured with a CCD-coupled X-ray image intensifier.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1422, doi. 10.1107/S0021889800013285

By:

van Reeuwijk, S.J.;
Vonk, V.;
Puig-Molina, A.;
Graafsma, H.

Publication type:

Article

Bayesian estimation of hyperparameters for indirect Fourier transformation in small-angle scattering.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1415, doi. 10.1107/S0021889800012930

By:

Hansen, Steen

Publication type:

Article

Kinematical two-dimensional multiple-diffraction intensity profiles. Application to ω-ψ scans obtained with Cu Kα radiation.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1405, doi. 10.1107/S002188980001270X

By:

Rossmanith, Elisabeth

Publication type:

Article

On the resolution of neutron scattering instruments.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1399, doi. 10.1107/S0021889800013236

By:

Cussen, Leo D.

Publication type:

Article

Resolution calculations for novel neutron beam elements.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1393, doi. 10.1107/S0021889800013224

By:

Cussen, Leo D.

Publication type:

Article

A small-angle neutron scattering model for polydisperse spherical particles with diffusion zones and application to soft magnetic metallic glass.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1386, doi. 10.1107/S0021889800013248

By:

Heinemann, Andre;
Hermann, Helmut;
Widenmann, Albrecht;
Mattern, Norbert;
Wetzig, Klaus

Publication type:

Article

A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1376, doi. 10.1107/S0021889800012772

By:

Nakashima, Kiichi

Publication type:

Article

Coupling between spatial and angular variables in surface X-ray diffraction: effects on the line shapes and integrated intensities.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1365, doi. 10.1107/S0021889800012188

By:

Jedrecy, Nathalie

Publication type:

Article

Hardness of oxide films formed as a result of aluminium anode oxidation processes.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1360

By:

Chris, M.;
Cojocaru, M.O.;
Palmer, R.A.

Publication type:

Article

X-ray diffractometer for structural studies of surfaces and interfaces.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1342, doi. 10.1107/S0021889800011468

By:

van Silfhout, R.G.

Publication type:

Article

Estimating nanoparticle size from diffraction measurements.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1335, doi. 10.1107/S0021889800010888

By:

Hall, B.D.;
Zanchet, D.;
Ugarte, D.

Publication type:

Article

Analysis of the asymptotic properties of X-ray line broadening caused by dislocations.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1329, doi. 10.1107/S002188980001058X

By:

Groma, I.;
Szekely, F.

Publication type:

Article

Estimation of statistical uncertainties in quantitative phase analysis using the Rietveld method and the whole-powder-pattern decomposition method.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1324, doi. 10.1107/S0021889800010402

By:

Toraya, H.

Publication type:

Article

Kα[sub1]-Kα[sub2] characteristic of a parabolic graded multilayer.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1317, doi. 10.1107/S0021889800010396

By:

Toraya, H.;
Hibino, H.

Publication type:

Article

Extended pseudo-Voigt function for approximating the Voigt profile.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1311, doi. 10.1107/S0021889800010219

By:

Ida, T.;
Ando, M.;
Toraya, H.

Publication type:

Article

Completion of crystal structures from powder data: the use of the coordination polyhedra.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 6, p. 1305, doi. 10.1107/S0021889800010852

By:

Altomare, Angela;
Giacovazzo, Carmelo;
Guagliardi, Antonietta;
Moliterni, Anna Grazia Giuseppina;
Rizzi, Rosanna

Publication type:

Article